Laser-induced stress wave propagation through smooth and rough substrates
We investigate laser-induced acoustic wave propagation through smooth and roughened titanium-coated glass substrates. Acoustic waves are generated in a controlled manner via the laser spallation technique. Surface displacements are measured during stress wave loading by alignment of a Michelson-type...
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creator | Boyd, James D Grady, Martha E |
description | We investigate laser-induced acoustic wave propagation through smooth and
roughened titanium-coated glass substrates. Acoustic waves are generated in a
controlled manner via the laser spallation technique. Surface displacements are
measured during stress wave loading by alignment of a Michelson-type
interferometer. A reflective coverslip panel facilitates capture of surface
displacements during loading of as-received smooth and roughened specimens.
Through interferometric experiments we extract the substrate stress profile at
each laser fluence (energy per area). The shape and amplitude of the substrate
stress profile is analyzed at each laser fluence. Peak substrate stress is
averaged and compared between smooth specimens with reflective panel and rough
specimens with reflective panel. The reflective panel is necessary because the
surface roughness of the rough specimens precludes in situ interferometry.
Through these experiments we determine that the surface roughness employed has
no significant effect on substrate stress propagation and smooth substrates are
an appropriate surrogate to determine stress wave loading amplitude of
roughened surfaces less than 1.2 {\mu}m average roughness (Ra). No significant
difference was observed when comparing the average peak amplitude and loading
slope in the stress wave profile for the smooth and rough configurations at
each fluence. |
doi_str_mv | 10.48550/arxiv.2007.02908 |
format | Article |
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roughened titanium-coated glass substrates. Acoustic waves are generated in a
controlled manner via the laser spallation technique. Surface displacements are
measured during stress wave loading by alignment of a Michelson-type
interferometer. A reflective coverslip panel facilitates capture of surface
displacements during loading of as-received smooth and roughened specimens.
Through interferometric experiments we extract the substrate stress profile at
each laser fluence (energy per area). The shape and amplitude of the substrate
stress profile is analyzed at each laser fluence. Peak substrate stress is
averaged and compared between smooth specimens with reflective panel and rough
specimens with reflective panel. The reflective panel is necessary because the
surface roughness of the rough specimens precludes in situ interferometry.
Through these experiments we determine that the surface roughness employed has
no significant effect on substrate stress propagation and smooth substrates are
an appropriate surrogate to determine stress wave loading amplitude of
roughened surfaces less than 1.2 {\mu}m average roughness (Ra). No significant
difference was observed when comparing the average peak amplitude and loading
slope in the stress wave profile for the smooth and rough configurations at
each fluence.</description><identifier>DOI: 10.48550/arxiv.2007.02908</identifier><language>eng</language><subject>Physics - Applied Physics</subject><creationdate>2020-07</creationdate><rights>http://creativecommons.org/licenses/by-nc-sa/4.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,780,885</link.rule.ids><linktorsrc>$$Uhttps://arxiv.org/abs/2007.02908$$EView_record_in_Cornell_University$$FView_record_in_$$GCornell_University$$Hfree_for_read</linktorsrc><backlink>$$Uhttps://doi.org/10.48550/arXiv.2007.02908$$DView paper in arXiv$$Hfree_for_read</backlink></links><search><creatorcontrib>Boyd, James D</creatorcontrib><creatorcontrib>Grady, Martha E</creatorcontrib><title>Laser-induced stress wave propagation through smooth and rough substrates</title><description>We investigate laser-induced acoustic wave propagation through smooth and
roughened titanium-coated glass substrates. Acoustic waves are generated in a
controlled manner via the laser spallation technique. Surface displacements are
measured during stress wave loading by alignment of a Michelson-type
interferometer. A reflective coverslip panel facilitates capture of surface
displacements during loading of as-received smooth and roughened specimens.
Through interferometric experiments we extract the substrate stress profile at
each laser fluence (energy per area). The shape and amplitude of the substrate
stress profile is analyzed at each laser fluence. Peak substrate stress is
averaged and compared between smooth specimens with reflective panel and rough
specimens with reflective panel. The reflective panel is necessary because the
surface roughness of the rough specimens precludes in situ interferometry.
Through these experiments we determine that the surface roughness employed has
no significant effect on substrate stress propagation and smooth substrates are
an appropriate surrogate to determine stress wave loading amplitude of
roughened surfaces less than 1.2 {\mu}m average roughness (Ra). No significant
difference was observed when comparing the average peak amplitude and loading
slope in the stress wave profile for the smooth and rough configurations at
each fluence.</description><subject>Physics - Applied Physics</subject><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>GOX</sourceid><recordid>eNotj8FOwzAQRH3pARU-gBP-gYR1nNjOEVUFKkXiAPdoHW-aSDSObKctf08pPc1opDfSY-xRQF6aqoJnDOfxmBcAOoeiBnPHdg1GCtk4uaUjx2MKFCM_4ZH4HPyMe0yjn3gagl_2A48H79PAcXL8Niz2wmCieM9WPX5Herjlmn2-br8271nz8bbbvDQZKm0yq2UvO4nGWTRE0FmneiGhJ-OELo1FXSpV1wiKispeiiis7UjqWmhp5Jo9_b9eVdo5jAcMP-2fUntVkr-Q6UhB</recordid><startdate>20200706</startdate><enddate>20200706</enddate><creator>Boyd, James D</creator><creator>Grady, Martha E</creator><scope>GOX</scope></search><sort><creationdate>20200706</creationdate><title>Laser-induced stress wave propagation through smooth and rough substrates</title><author>Boyd, James D ; Grady, Martha E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a678-b73f3c3a8dba8ee0cbd6f130fe8d1748ba746699a06e25b99a12bbce37917383</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Physics - Applied Physics</topic><toplevel>online_resources</toplevel><creatorcontrib>Boyd, James D</creatorcontrib><creatorcontrib>Grady, Martha E</creatorcontrib><collection>arXiv.org</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Boyd, James D</au><au>Grady, Martha E</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Laser-induced stress wave propagation through smooth and rough substrates</atitle><date>2020-07-06</date><risdate>2020</risdate><abstract>We investigate laser-induced acoustic wave propagation through smooth and
roughened titanium-coated glass substrates. Acoustic waves are generated in a
controlled manner via the laser spallation technique. Surface displacements are
measured during stress wave loading by alignment of a Michelson-type
interferometer. A reflective coverslip panel facilitates capture of surface
displacements during loading of as-received smooth and roughened specimens.
Through interferometric experiments we extract the substrate stress profile at
each laser fluence (energy per area). The shape and amplitude of the substrate
stress profile is analyzed at each laser fluence. Peak substrate stress is
averaged and compared between smooth specimens with reflective panel and rough
specimens with reflective panel. The reflective panel is necessary because the
surface roughness of the rough specimens precludes in situ interferometry.
Through these experiments we determine that the surface roughness employed has
no significant effect on substrate stress propagation and smooth substrates are
an appropriate surrogate to determine stress wave loading amplitude of
roughened surfaces less than 1.2 {\mu}m average roughness (Ra). No significant
difference was observed when comparing the average peak amplitude and loading
slope in the stress wave profile for the smooth and rough configurations at
each fluence.</abstract><doi>10.48550/arxiv.2007.02908</doi><oa>free_for_read</oa></addata></record> |
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subjects | Physics - Applied Physics |
title | Laser-induced stress wave propagation through smooth and rough substrates |
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