EBIT Observation of Ar Dielectronic Recombination Lines Near the Unknown Faint X-Ray Feature Found in the Stacked Spectrum of Galaxy Clusters

Motivated by possible atomic origins of the unidentified emission line detected at 3.55 keV to 3.57 keV in a stacked spectrum of galaxy clusters (Bulbul et al. 2014), an electron beam ion trap (EBIT) was used to investigate the resonant dielectronic recombination (DR) process in highly-charged argon...

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Veröffentlicht in:	arXiv.org 2019-02
Hauptverfasser:	Gall, Amy C, Foster, Adam R, Silwal, Roshani, Dreiling, Joan M, Borovik, Alexander, Kilgore, Ethan, Ajello, Marco, Gillaspy, John D, Ralchenko, Yuri, Takacs, Endre
Format:	Artikel
Sprache:	eng
Schlagworte:	Argon Argon ions Direct reduction Electron beams Electron energy Emission Galactic clusters Galaxies Ion recombination Physics - Atomic Physics Physics - High Energy Astrophysical Phenomena Spectra
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