Design and characterization of dielectric filled TM\(_{110}\) microwave cavities for ultrafast electron microscopy

Microwave cavities oscillating in the TM\(_{110}\) mode can be used as dynamic electron-optical elements inside an electron microscope. By filling the cavity with a dielectric material it becomes more compact and power efficient, facilitating the implementation in an electron microscope. However, th...

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Veröffentlicht in:	arXiv.org 2018-11
Hauptverfasser:	Verhoeven, W, J F M van Rens, Kemper, A H, Rietman, E H, van Doorn, H A, Koole, I, Kieft, E R, Mutsaers, P H A, Luiten, O J
Format:	Artikel
Sprache:	eng
Schlagworte:	Dielectrics Electron microscopes Electron microscopy Field strength Holes Microscopy Optical components Physics - Applied Physics Physics - Instrumentation and Detectors Power consumption
Online-Zugang:	Volltext
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