Direct Detection of Axion-Like Particles in Bismuth-Based Topological Insulators
In recent years a new field emerged in dark matter community and immediately attracted a multitude of theoriests and experimentalists, that of light dark matter direct detection in electronic systems. The phenomenon is similar with nuclear recoil in elastic scattering between dark matter and nucleus...
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| description | In recent years a new field emerged in dark matter community and immediately attracted a multitude of theoriests and experimentalists, that of light dark matter direct detection in electronic systems. The phenomenon is similar with nuclear recoil in elastic scattering between dark matter and nucleus but with different kinematics. Due to the small energy gap, the electronic system can probe sub-GeV dark matter rather than nucleus target. In particular the absorption into materials can even detect ultra-light dark matter within mass around meV. In terms of the equivalence between optical conductivity and absorption cross section, axion detection can be computed in Bismuth-based topological insulators. It is found that topological insulator has strong sensitivity on axion and provides a complementary direct detection to superconductor and semiconductors. The novelty of topological insulator is that the thin film could even obtain the same sensitivity as superconductor. |
| doi_str_mv | 10.48550/arxiv.1807.11757 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_arxiv</sourceid><recordid>TN_cdi_arxiv_primary_1807_11757</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2092766828</sourcerecordid><originalsourceid>FETCH-LOGICAL-a528-5799ba4248f22c30002e8c3e223ce2843450d61d761a3a071c6d6729b6a648793</originalsourceid><addsrcrecordid>eNotj8tOwzAURC0kJKrSD2CFJdYp9vUzyz6gVKpEF91HruOASxoHO0Hl70lbVjOL0egchB4omXItBHk28eR_plQTNaVUCXWDRsAYzTQHuEOTlA6EEJAKhGAjtF366GyHl64bwocGhwrPTkPJNv7L4a2Jnbe1S9g3eO7Tse8-s7lJrsS70IY6fHhrarxuUl-bLsR0j24rUyc3-c8x2r2-7BZv2eZ9tV7MNpkRoDOh8nxvOHBdAVh2JnLaMgfArAPNGReklLRUkhpmiKJWlgNyvpdGcq1yNkaP19uLbtFGfzTxtzhrFxftYfF0XbQxfPcudcUh9LEZmAogOSgpNWj2B5EhWRE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2092766828</pqid></control><display><type>article</type><title>Direct Detection of Axion-Like Particles in Bismuth-Based Topological Insulators</title><source>arXiv.org</source><source>Free E- Journals</source><creator>Liang, Tairan ; Zhu, Bin ; Ding, Ran ; Li, Tianjun</creator><creatorcontrib>Liang, Tairan ; Zhu, Bin ; Ding, Ran ; Li, Tianjun</creatorcontrib><description>In recent years a new field emerged in dark matter community and immediately attracted a multitude of theoriests and experimentalists, that of light dark matter direct detection in electronic systems. The phenomenon is similar with nuclear recoil in elastic scattering between dark matter and nucleus but with different kinematics. Due to the small energy gap, the electronic system can probe sub-GeV dark matter rather than nucleus target. In particular the absorption into materials can even detect ultra-light dark matter within mass around meV. In terms of the equivalence between optical conductivity and absorption cross section, axion detection can be computed in Bismuth-based topological insulators. It is found that topological insulator has strong sensitivity on axion and provides a complementary direct detection to superconductor and semiconductors. The novelty of topological insulator is that the thin film could even obtain the same sensitivity as superconductor.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.1807.11757</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Absorption cross sections ; Bismuth ; Dark matter ; Elastic scattering ; Electronic systems ; Energy gap ; Kinematics ; Physics - High Energy Physics - Phenomenology ; Recoil ; Sensitivity ; Thin films ; Topological insulators ; Topology</subject><ispartof>arXiv.org, 2018-07</ispartof><rights>2018. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><rights>http://arxiv.org/licenses/nonexclusive-distrib/1.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,780,784,885,27925</link.rule.ids><backlink>$$Uhttps://doi.org/10.48550/arXiv.1807.11757$$DView paper in arXiv$$Hfree_for_read</backlink><backlink>$$Uhttps://doi.org/10.1142/S0217751X1850135X$$DView published paper (Access to full text may be restricted)$$Hfree_for_read</backlink></links><search><creatorcontrib>Liang, Tairan</creatorcontrib><creatorcontrib>Zhu, Bin</creatorcontrib><creatorcontrib>Ding, Ran</creatorcontrib><creatorcontrib>Li, Tianjun</creatorcontrib><title>Direct Detection of Axion-Like Particles in Bismuth-Based Topological Insulators</title><title>arXiv.org</title><description>In recent years a new field emerged in dark matter community and immediately attracted a multitude of theoriests and experimentalists, that of light dark matter direct detection in electronic systems. The phenomenon is similar with nuclear recoil in elastic scattering between dark matter and nucleus but with different kinematics. Due to the small energy gap, the electronic system can probe sub-GeV dark matter rather than nucleus target. In particular the absorption into materials can even detect ultra-light dark matter within mass around meV. In terms of the equivalence between optical conductivity and absorption cross section, axion detection can be computed in Bismuth-based topological insulators. It is found that topological insulator has strong sensitivity on axion and provides a complementary direct detection to superconductor and semiconductors. The novelty of topological insulator is that the thin film could even obtain the same sensitivity as superconductor.</description><subject>Absorption cross sections</subject><subject>Bismuth</subject><subject>Dark matter</subject><subject>Elastic scattering</subject><subject>Electronic systems</subject><subject>Energy gap</subject><subject>Kinematics</subject><subject>Physics - High Energy Physics - Phenomenology</subject><subject>Recoil</subject><subject>Sensitivity</subject><subject>Thin films</subject><subject>Topological insulators</subject><subject>Topology</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GOX</sourceid><recordid>eNotj8tOwzAURC0kJKrSD2CFJdYp9vUzyz6gVKpEF91HruOASxoHO0Hl70lbVjOL0egchB4omXItBHk28eR_plQTNaVUCXWDRsAYzTQHuEOTlA6EEJAKhGAjtF366GyHl64bwocGhwrPTkPJNv7L4a2Jnbe1S9g3eO7Tse8-s7lJrsS70IY6fHhrarxuUl-bLsR0j24rUyc3-c8x2r2-7BZv2eZ9tV7MNpkRoDOh8nxvOHBdAVh2JnLaMgfArAPNGReklLRUkhpmiKJWlgNyvpdGcq1yNkaP19uLbtFGfzTxtzhrFxftYfF0XbQxfPcudcUh9LEZmAogOSgpNWj2B5EhWRE</recordid><startdate>20180731</startdate><enddate>20180731</enddate><creator>Liang, Tairan</creator><creator>Zhu, Bin</creator><creator>Ding, Ran</creator><creator>Li, Tianjun</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>GOX</scope></search><sort><creationdate>20180731</creationdate><title>Direct Detection of Axion-Like Particles in Bismuth-Based Topological Insulators</title><author>Liang, Tairan ; Zhu, Bin ; Ding, Ran ; Li, Tianjun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a528-5799ba4248f22c30002e8c3e223ce2843450d61d761a3a071c6d6729b6a648793</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Absorption cross sections</topic><topic>Bismuth</topic><topic>Dark matter</topic><topic>Elastic scattering</topic><topic>Electronic systems</topic><topic>Energy gap</topic><topic>Kinematics</topic><topic>Physics - High Energy Physics - Phenomenology</topic><topic>Recoil</topic><topic>Sensitivity</topic><topic>Thin films</topic><topic>Topological insulators</topic><topic>Topology</topic><toplevel>online_resources</toplevel><creatorcontrib>Liang, Tairan</creatorcontrib><creatorcontrib>Zhu, Bin</creatorcontrib><creatorcontrib>Ding, Ran</creatorcontrib><creatorcontrib>Li, Tianjun</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>arXiv.org</collection><jtitle>arXiv.org</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liang, Tairan</au><au>Zhu, Bin</au><au>Ding, Ran</au><au>Li, Tianjun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Direct Detection of Axion-Like Particles in Bismuth-Based Topological Insulators</atitle><jtitle>arXiv.org</jtitle><date>2018-07-31</date><risdate>2018</risdate><eissn>2331-8422</eissn><abstract>In recent years a new field emerged in dark matter community and immediately attracted a multitude of theoriests and experimentalists, that of light dark matter direct detection in electronic systems. The phenomenon is similar with nuclear recoil in elastic scattering between dark matter and nucleus but with different kinematics. Due to the small energy gap, the electronic system can probe sub-GeV dark matter rather than nucleus target. In particular the absorption into materials can even detect ultra-light dark matter within mass around meV. In terms of the equivalence between optical conductivity and absorption cross section, axion detection can be computed in Bismuth-based topological insulators. It is found that topological insulator has strong sensitivity on axion and provides a complementary direct detection to superconductor and semiconductors. The novelty of topological insulator is that the thin film could even obtain the same sensitivity as superconductor.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><doi>10.48550/arxiv.1807.11757</doi><oa>free_for_read</oa></addata></record> |
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| subjects | Absorption cross sections Bismuth Dark matter Elastic scattering Electronic systems Energy gap Kinematics Physics - High Energy Physics - Phenomenology Recoil Sensitivity Thin films Topological insulators Topology |
| title | Direct Detection of Axion-Like Particles in Bismuth-Based Topological Insulators |
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