Unified mechanism of the surface Fermi level pinning in III-As nanowires

Fermi level pinning at the oxidized (110) surfaces of III-As nanowires (GaAs, InAs, InGaAs, AlGaAs) is studied. Using scanning gradient Kelvin probe microscopy, we show that the Fermi level at oxidized cleavage surfaces of ternary Al\(_{x}\)Ga\(_{1-x}\)As (0\(\le\)x\(\le\)0.45) and Ga\(_{x}\)In\(_{1...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:arXiv.org 2017-11
Hauptverfasser: Alekseev, P A, Dunaevskiy, M S, Cirlin, G E, Reznik, R R, Smirnov, A N, V Yu Davydov, Berkovits, V L
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title arXiv.org
container_volume
creator Alekseev, P A
Dunaevskiy, M S
Cirlin, G E
Reznik, R R
Smirnov, A N
V Yu Davydov
Berkovits, V L
description Fermi level pinning at the oxidized (110) surfaces of III-As nanowires (GaAs, InAs, InGaAs, AlGaAs) is studied. Using scanning gradient Kelvin probe microscopy, we show that the Fermi level at oxidized cleavage surfaces of ternary Al\(_{x}\)Ga\(_{1-x}\)As (0\(\le\)x\(\le\)0.45) and Ga\(_{x}\)In\(_{1-x}\)As (0\(\le\)x\(\le\)1) alloys is pinned at the same position of 4.8\(\pm\)0.1 eV with regard to the vacuum level. The finding implies a unified mechanism of the Fermi level pinning for such surfaces. Further investigation, performed by Raman scattering and photoluminescence spectroscopy, shows that photooxidation of the Al\(_{x}\)Ga\(_{1-x}\)As and Ga\(_{x}\)In\(_{1-x}\)As nanowires leads to the accumulation of an excess arsenic on their crystal surfaces which is accompanied by a strong decrease of the band-edge photoluminescence intensity. We conclude that the surface excess arsenic in crystalline or amorphous forms is responsible for the Fermi level pinning at oxidized (110) surfaces of III-As nanowires.
doi_str_mv 10.48550/arxiv.1710.06227
format Article
fullrecord <record><control><sourceid>proquest_arxiv</sourceid><recordid>TN_cdi_arxiv_primary_1710_06227</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2073921023</sourcerecordid><originalsourceid>FETCH-LOGICAL-a523-84e03fa87d560e836c7614631a042556012262f68c999fc845271b09db197aab3</originalsourceid><addsrcrecordid>eNotkFFLwzAUhYMgOOZ-gE8GfO68uWmS9nEM5woDX-ZzSdvEZbRpTdap_966-XTgcrh83yHkgcEyzYSAZx2-3XnJ1HQAiahuyAw5Z0mWIt6RRYxHAECpUAg-I9t376wzDe1MfdDexY72lp4OhsYxWF0bujGhc7Q1Z9PSwXnv_Ad1nhZFkawi9dr3Xy6YeE9urW6jWfznnOw3L_v1Ntm9vRbr1S7RAvkEYYBbnalGSDAZl7WSLJWcaUgnIAkMUaKVWZ3nua2zVKBiFeRNxXKldcXn5PH69qJZDsF1OvyUf7rlRXdqPF0bQ-g_RxNP5bEfg5-YSgTFc2Qw7fEL3bVVbw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2073921023</pqid></control><display><type>article</type><title>Unified mechanism of the surface Fermi level pinning in III-As nanowires</title><source>arXiv.org</source><source>Free E- Journals</source><creator>Alekseev, P A ; Dunaevskiy, M S ; Cirlin, G E ; Reznik, R R ; Smirnov, A N ; V Yu Davydov ; Berkovits, V L</creator><creatorcontrib>Alekseev, P A ; Dunaevskiy, M S ; Cirlin, G E ; Reznik, R R ; Smirnov, A N ; V Yu Davydov ; Berkovits, V L</creatorcontrib><description>Fermi level pinning at the oxidized (110) surfaces of III-As nanowires (GaAs, InAs, InGaAs, AlGaAs) is studied. Using scanning gradient Kelvin probe microscopy, we show that the Fermi level at oxidized cleavage surfaces of ternary Al\(_{x}\)Ga\(_{1-x}\)As (0\(\le\)x\(\le\)0.45) and Ga\(_{x}\)In\(_{1-x}\)As (0\(\le\)x\(\le\)1) alloys is pinned at the same position of 4.8\(\pm\)0.1 eV with regard to the vacuum level. The finding implies a unified mechanism of the Fermi level pinning for such surfaces. Further investigation, performed by Raman scattering and photoluminescence spectroscopy, shows that photooxidation of the Al\(_{x}\)Ga\(_{1-x}\)As and Ga\(_{x}\)In\(_{1-x}\)As nanowires leads to the accumulation of an excess arsenic on their crystal surfaces which is accompanied by a strong decrease of the band-edge photoluminescence intensity. We conclude that the surface excess arsenic in crystalline or amorphous forms is responsible for the Fermi level pinning at oxidized (110) surfaces of III-As nanowires.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.1710.06227</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Arsenic ; Crystal surfaces ; Fermi level ; Fermi surfaces ; Indium gallium arsenides ; Nanowires ; Photoluminescence ; Photooxidation ; Physics - Mesoscale and Nanoscale Physics ; Pinning ; Raman spectra ; Scanning electron microscopy ; Silicon</subject><ispartof>arXiv.org, 2017-11</ispartof><rights>2017. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><rights>http://arxiv.org/licenses/nonexclusive-distrib/1.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,780,784,885,27925</link.rule.ids><backlink>$$Uhttps://doi.org/10.1088/1361-6528/aac480$$DView published paper (Access to full text may be restricted)$$Hfree_for_read</backlink><backlink>$$Uhttps://doi.org/10.48550/arXiv.1710.06227$$DView paper in arXiv$$Hfree_for_read</backlink></links><search><creatorcontrib>Alekseev, P A</creatorcontrib><creatorcontrib>Dunaevskiy, M S</creatorcontrib><creatorcontrib>Cirlin, G E</creatorcontrib><creatorcontrib>Reznik, R R</creatorcontrib><creatorcontrib>Smirnov, A N</creatorcontrib><creatorcontrib>V Yu Davydov</creatorcontrib><creatorcontrib>Berkovits, V L</creatorcontrib><title>Unified mechanism of the surface Fermi level pinning in III-As nanowires</title><title>arXiv.org</title><description>Fermi level pinning at the oxidized (110) surfaces of III-As nanowires (GaAs, InAs, InGaAs, AlGaAs) is studied. Using scanning gradient Kelvin probe microscopy, we show that the Fermi level at oxidized cleavage surfaces of ternary Al\(_{x}\)Ga\(_{1-x}\)As (0\(\le\)x\(\le\)0.45) and Ga\(_{x}\)In\(_{1-x}\)As (0\(\le\)x\(\le\)1) alloys is pinned at the same position of 4.8\(\pm\)0.1 eV with regard to the vacuum level. The finding implies a unified mechanism of the Fermi level pinning for such surfaces. Further investigation, performed by Raman scattering and photoluminescence spectroscopy, shows that photooxidation of the Al\(_{x}\)Ga\(_{1-x}\)As and Ga\(_{x}\)In\(_{1-x}\)As nanowires leads to the accumulation of an excess arsenic on their crystal surfaces which is accompanied by a strong decrease of the band-edge photoluminescence intensity. We conclude that the surface excess arsenic in crystalline or amorphous forms is responsible for the Fermi level pinning at oxidized (110) surfaces of III-As nanowires.</description><subject>Arsenic</subject><subject>Crystal surfaces</subject><subject>Fermi level</subject><subject>Fermi surfaces</subject><subject>Indium gallium arsenides</subject><subject>Nanowires</subject><subject>Photoluminescence</subject><subject>Photooxidation</subject><subject>Physics - Mesoscale and Nanoscale Physics</subject><subject>Pinning</subject><subject>Raman spectra</subject><subject>Scanning electron microscopy</subject><subject>Silicon</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GOX</sourceid><recordid>eNotkFFLwzAUhYMgOOZ-gE8GfO68uWmS9nEM5woDX-ZzSdvEZbRpTdap_966-XTgcrh83yHkgcEyzYSAZx2-3XnJ1HQAiahuyAw5Z0mWIt6RRYxHAECpUAg-I9t376wzDe1MfdDexY72lp4OhsYxWF0bujGhc7Q1Z9PSwXnv_Ad1nhZFkawi9dr3Xy6YeE9urW6jWfznnOw3L_v1Ntm9vRbr1S7RAvkEYYBbnalGSDAZl7WSLJWcaUgnIAkMUaKVWZ3nua2zVKBiFeRNxXKldcXn5PH69qJZDsF1OvyUf7rlRXdqPF0bQ-g_RxNP5bEfg5-YSgTFc2Qw7fEL3bVVbw</recordid><startdate>20171117</startdate><enddate>20171117</enddate><creator>Alekseev, P A</creator><creator>Dunaevskiy, M S</creator><creator>Cirlin, G E</creator><creator>Reznik, R R</creator><creator>Smirnov, A N</creator><creator>V Yu Davydov</creator><creator>Berkovits, V L</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>GOX</scope></search><sort><creationdate>20171117</creationdate><title>Unified mechanism of the surface Fermi level pinning in III-As nanowires</title><author>Alekseev, P A ; Dunaevskiy, M S ; Cirlin, G E ; Reznik, R R ; Smirnov, A N ; V Yu Davydov ; Berkovits, V L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a523-84e03fa87d560e836c7614631a042556012262f68c999fc845271b09db197aab3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Arsenic</topic><topic>Crystal surfaces</topic><topic>Fermi level</topic><topic>Fermi surfaces</topic><topic>Indium gallium arsenides</topic><topic>Nanowires</topic><topic>Photoluminescence</topic><topic>Photooxidation</topic><topic>Physics - Mesoscale and Nanoscale Physics</topic><topic>Pinning</topic><topic>Raman spectra</topic><topic>Scanning electron microscopy</topic><topic>Silicon</topic><toplevel>online_resources</toplevel><creatorcontrib>Alekseev, P A</creatorcontrib><creatorcontrib>Dunaevskiy, M S</creatorcontrib><creatorcontrib>Cirlin, G E</creatorcontrib><creatorcontrib>Reznik, R R</creatorcontrib><creatorcontrib>Smirnov, A N</creatorcontrib><creatorcontrib>V Yu Davydov</creatorcontrib><creatorcontrib>Berkovits, V L</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>arXiv.org</collection><jtitle>arXiv.org</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Alekseev, P A</au><au>Dunaevskiy, M S</au><au>Cirlin, G E</au><au>Reznik, R R</au><au>Smirnov, A N</au><au>V Yu Davydov</au><au>Berkovits, V L</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Unified mechanism of the surface Fermi level pinning in III-As nanowires</atitle><jtitle>arXiv.org</jtitle><date>2017-11-17</date><risdate>2017</risdate><eissn>2331-8422</eissn><abstract>Fermi level pinning at the oxidized (110) surfaces of III-As nanowires (GaAs, InAs, InGaAs, AlGaAs) is studied. Using scanning gradient Kelvin probe microscopy, we show that the Fermi level at oxidized cleavage surfaces of ternary Al\(_{x}\)Ga\(_{1-x}\)As (0\(\le\)x\(\le\)0.45) and Ga\(_{x}\)In\(_{1-x}\)As (0\(\le\)x\(\le\)1) alloys is pinned at the same position of 4.8\(\pm\)0.1 eV with regard to the vacuum level. The finding implies a unified mechanism of the Fermi level pinning for such surfaces. Further investigation, performed by Raman scattering and photoluminescence spectroscopy, shows that photooxidation of the Al\(_{x}\)Ga\(_{1-x}\)As and Ga\(_{x}\)In\(_{1-x}\)As nanowires leads to the accumulation of an excess arsenic on their crystal surfaces which is accompanied by a strong decrease of the band-edge photoluminescence intensity. We conclude that the surface excess arsenic in crystalline or amorphous forms is responsible for the Fermi level pinning at oxidized (110) surfaces of III-As nanowires.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><doi>10.48550/arxiv.1710.06227</doi><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier EISSN: 2331-8422
ispartof arXiv.org, 2017-11
issn 2331-8422
language eng
recordid cdi_arxiv_primary_1710_06227
source arXiv.org; Free E- Journals
subjects Arsenic
Crystal surfaces
Fermi level
Fermi surfaces
Indium gallium arsenides
Nanowires
Photoluminescence
Photooxidation
Physics - Mesoscale and Nanoscale Physics
Pinning
Raman spectra
Scanning electron microscopy
Silicon
title Unified mechanism of the surface Fermi level pinning in III-As nanowires
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T03%3A30%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_arxiv&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Unified%20mechanism%20of%20the%20surface%20Fermi%20level%20pinning%20in%20III-As%20nanowires&rft.jtitle=arXiv.org&rft.au=Alekseev,%20P%20A&rft.date=2017-11-17&rft.eissn=2331-8422&rft_id=info:doi/10.48550/arxiv.1710.06227&rft_dat=%3Cproquest_arxiv%3E2073921023%3C/proquest_arxiv%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2073921023&rft_id=info:pmid/&rfr_iscdi=true