Charge Fractionalization in a Kondo Device
We study nonequilibrium transport through a charge Kondo device realizing the two-channel Kondo critical point in a recent experiment by Iftikhar et al. By computing the current and shot noise at low voltages near the critical point, we obtain a universal Fano factor \(e^*/e=1/2\). We identify eleme...
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| creator | Landau, L A Cornfeld, E Sela, E |
| description | We study nonequilibrium transport through a charge Kondo device realizing the two-channel Kondo critical point in a recent experiment by Iftikhar et al. By computing the current and shot noise at low voltages near the critical point, we obtain a universal Fano factor \(e^*/e=1/2\). We identify elementary transport processes as weak scattering of emergent fermions carrying half-integer charge quantum numbers. This forms an experimental fingerprint for fractionalization in a non-Fermi liquid, which, compared to spin-Kondo devices, could be observed at elevated temperatures. |
| doi_str_mv | 10.48550/arxiv.1710.03030 |
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| fullrecord | <record><control><sourceid>proquest_arxiv</sourceid><recordid>TN_cdi_arxiv_primary_1710_03030</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2072259832</sourcerecordid><originalsourceid>FETCH-LOGICAL-a522-e49054edfa7d4f85c85c0d29f95fa45024f340d7897704fff0aa7f6304c86cc33</originalsourceid><addsrcrecordid>eNotj09LAzEQxYMgWGo_gCcXvAlbZyfJJnuU1WppwUvvYcgfTam7NWmL-undtjIP5vF4DPNj7KaCqdBSwgOl73iYVmoIgA9zwUbIeVVqgXjFJjmvAQBrhVLyEbtvPyi9-2KWyO5i39Em_tLRFLErqFj0neuLJ3-I1l-zy0Cb7Cf_e8xWs-dV-1ou317m7eOyJIlYetGAFN4FUk4ELe0gcNiERgYSElAELsAp3SgFIoQARCrUHITVtbWcj9nt-ewJxGxT_KT0Y45A5gQ0NO7OjW3qv_Y-78y636fh9WwQFKJsNEf-BzhFS_I</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2072259832</pqid></control><display><type>article</type><title>Charge Fractionalization in a Kondo Device</title><source>arXiv.org</source><source>Free E- Journals</source><creator>Landau, L A ; Cornfeld, E ; Sela, E</creator><creatorcontrib>Landau, L A ; Cornfeld, E ; Sela, E</creatorcontrib><description>We study nonequilibrium transport through a charge Kondo device realizing the two-channel Kondo critical point in a recent experiment by Iftikhar et al. By computing the current and shot noise at low voltages near the critical point, we obtain a universal Fano factor \(e^*/e=1/2\). We identify elementary transport processes as weak scattering of emergent fermions carrying half-integer charge quantum numbers. This forms an experimental fingerprint for fractionalization in a non-Fermi liquid, which, compared to spin-Kondo devices, could be observed at elevated temperatures.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.1710.03030</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Charge transport ; Critical point ; Current carriers ; Fermi liquids ; Fermions ; High temperature ; Kondo effect ; Physics - Mesoscale and Nanoscale Physics ; Physics - Strongly Correlated Electrons ; Quantum numbers ; Shot noise</subject><ispartof>arXiv.org, 2017-10</ispartof><rights>2017. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><rights>http://arxiv.org/licenses/nonexclusive-distrib/1.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,781,785,886,27930</link.rule.ids><backlink>$$Uhttps://doi.org/10.48550/arXiv.1710.03030$$DView paper in arXiv$$Hfree_for_read</backlink><backlink>$$Uhttps://doi.org/10.1103/PhysRevLett.120.186801$$DView published paper (Access to full text may be restricted)$$Hfree_for_read</backlink></links><search><creatorcontrib>Landau, L A</creatorcontrib><creatorcontrib>Cornfeld, E</creatorcontrib><creatorcontrib>Sela, E</creatorcontrib><title>Charge Fractionalization in a Kondo Device</title><title>arXiv.org</title><description>We study nonequilibrium transport through a charge Kondo device realizing the two-channel Kondo critical point in a recent experiment by Iftikhar et al. By computing the current and shot noise at low voltages near the critical point, we obtain a universal Fano factor \(e^*/e=1/2\). We identify elementary transport processes as weak scattering of emergent fermions carrying half-integer charge quantum numbers. This forms an experimental fingerprint for fractionalization in a non-Fermi liquid, which, compared to spin-Kondo devices, could be observed at elevated temperatures.</description><subject>Charge transport</subject><subject>Critical point</subject><subject>Current carriers</subject><subject>Fermi liquids</subject><subject>Fermions</subject><subject>High temperature</subject><subject>Kondo effect</subject><subject>Physics - Mesoscale and Nanoscale Physics</subject><subject>Physics - Strongly Correlated Electrons</subject><subject>Quantum numbers</subject><subject>Shot noise</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GOX</sourceid><recordid>eNotj09LAzEQxYMgWGo_gCcXvAlbZyfJJnuU1WppwUvvYcgfTam7NWmL-undtjIP5vF4DPNj7KaCqdBSwgOl73iYVmoIgA9zwUbIeVVqgXjFJjmvAQBrhVLyEbtvPyi9-2KWyO5i39Em_tLRFLErqFj0neuLJ3-I1l-zy0Cb7Cf_e8xWs-dV-1ou317m7eOyJIlYetGAFN4FUk4ELe0gcNiERgYSElAELsAp3SgFIoQARCrUHITVtbWcj9nt-ewJxGxT_KT0Y45A5gQ0NO7OjW3qv_Y-78y636fh9WwQFKJsNEf-BzhFS_I</recordid><startdate>20171009</startdate><enddate>20171009</enddate><creator>Landau, L A</creator><creator>Cornfeld, E</creator><creator>Sela, E</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>GOX</scope></search><sort><creationdate>20171009</creationdate><title>Charge Fractionalization in a Kondo Device</title><author>Landau, L A ; Cornfeld, E ; Sela, E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a522-e49054edfa7d4f85c85c0d29f95fa45024f340d7897704fff0aa7f6304c86cc33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Charge transport</topic><topic>Critical point</topic><topic>Current carriers</topic><topic>Fermi liquids</topic><topic>Fermions</topic><topic>High temperature</topic><topic>Kondo effect</topic><topic>Physics - Mesoscale and Nanoscale Physics</topic><topic>Physics - Strongly Correlated Electrons</topic><topic>Quantum numbers</topic><topic>Shot noise</topic><toplevel>online_resources</toplevel><creatorcontrib>Landau, L A</creatorcontrib><creatorcontrib>Cornfeld, E</creatorcontrib><creatorcontrib>Sela, E</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>SciTech Premium Collection (Proquest) (PQ_SDU_P3)</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Access via ProQuest (Open Access)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>arXiv.org</collection><jtitle>arXiv.org</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Landau, L A</au><au>Cornfeld, E</au><au>Sela, E</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Charge Fractionalization in a Kondo Device</atitle><jtitle>arXiv.org</jtitle><date>2017-10-09</date><risdate>2017</risdate><eissn>2331-8422</eissn><abstract>We study nonequilibrium transport through a charge Kondo device realizing the two-channel Kondo critical point in a recent experiment by Iftikhar et al. By computing the current and shot noise at low voltages near the critical point, we obtain a universal Fano factor \(e^*/e=1/2\). We identify elementary transport processes as weak scattering of emergent fermions carrying half-integer charge quantum numbers. This forms an experimental fingerprint for fractionalization in a non-Fermi liquid, which, compared to spin-Kondo devices, could be observed at elevated temperatures.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><doi>10.48550/arxiv.1710.03030</doi><oa>free_for_read</oa></addata></record> |
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| subjects | Charge transport Critical point Current carriers Fermi liquids Fermions High temperature Kondo effect Physics - Mesoscale and Nanoscale Physics Physics - Strongly Correlated Electrons Quantum numbers Shot noise |
| title | Charge Fractionalization in a Kondo Device |
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