Group Testing using left-and-right-regular sparse-graph codes
We consider the problem of non-adaptive group testing of $N$ items out of which $K$ or less items are known to be defective. We propose a testing scheme based on left-and-right-regular sparse-graph codes and a simple iterative decoder. We show that for any arbitrarily small $\epsilon>0$ our schem...
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creator | Vem, Avinash Janakiraman, Nagaraj T Narayanan, Krishna R |
description | We consider the problem of non-adaptive group testing of $N$ items out of
which $K$ or less items are known to be defective. We propose a testing scheme
based on left-and-right-regular sparse-graph codes and a simple iterative
decoder. We show that for any arbitrarily small $\epsilon>0$ our scheme
requires only $m=c_\epsilon K\log \frac{c_1N}{K}$ tests to recover
$(1-\epsilon)$ fraction of the defective items with high probability (w.h.p)
i.e., with probability approaching $1$ asymptotically in $N$ and $K$, where the
value of constants $c_\epsilon$ and $\ell$ are a function of the desired error
floor $\epsilon$ and constant $c_1=\frac{\ell}{c_\epsilon}$ (observed to be
approximately equal to 1 for various values of $\epsilon$). More importantly
the iterative decoding algorithm has a sub-linear computational complexity of
$\mathcal{O}(K\log \frac{N}{K})$ which is known to be optimal. Also for $m=c_2
K\log K\log \frac{N}{K}$ tests our scheme recovers the \textit{whole} set of
defective items w.h.p. These results are valid for both noiseless and noisy
versions of the problem as long as the number of defective items scale
sub-linearly with the total number of items, i.e., $K=o(N)$. The simulation
results validate the theoretical results by showing a substantial improvement
in the number of tests required when compared to the testing scheme based on
left-regular sparse-graphs. |
doi_str_mv | 10.48550/arxiv.1701.07477 |
format | Article |
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which $K$ or less items are known to be defective. We propose a testing scheme
based on left-and-right-regular sparse-graph codes and a simple iterative
decoder. We show that for any arbitrarily small $\epsilon>0$ our scheme
requires only $m=c_\epsilon K\log \frac{c_1N}{K}$ tests to recover
$(1-\epsilon)$ fraction of the defective items with high probability (w.h.p)
i.e., with probability approaching $1$ asymptotically in $N$ and $K$, where the
value of constants $c_\epsilon$ and $\ell$ are a function of the desired error
floor $\epsilon$ and constant $c_1=\frac{\ell}{c_\epsilon}$ (observed to be
approximately equal to 1 for various values of $\epsilon$). More importantly
the iterative decoding algorithm has a sub-linear computational complexity of
$\mathcal{O}(K\log \frac{N}{K})$ which is known to be optimal. Also for $m=c_2
K\log K\log \frac{N}{K}$ tests our scheme recovers the \textit{whole} set of
defective items w.h.p. These results are valid for both noiseless and noisy
versions of the problem as long as the number of defective items scale
sub-linearly with the total number of items, i.e., $K=o(N)$. The simulation
results validate the theoretical results by showing a substantial improvement
in the number of tests required when compared to the testing scheme based on
left-regular sparse-graphs.</description><identifier>DOI: 10.48550/arxiv.1701.07477</identifier><language>eng</language><subject>Computer Science - Information Theory ; Mathematics - Information Theory</subject><creationdate>2017-01</creationdate><rights>http://creativecommons.org/licenses/by/4.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,778,883</link.rule.ids><linktorsrc>$$Uhttps://arxiv.org/abs/1701.07477$$EView_record_in_Cornell_University$$FView_record_in_$$GCornell_University$$Hfree_for_read</linktorsrc><backlink>$$Uhttps://doi.org/10.48550/arXiv.1701.07477$$DView paper in arXiv$$Hfree_for_read</backlink></links><search><creatorcontrib>Vem, Avinash</creatorcontrib><creatorcontrib>Janakiraman, Nagaraj T</creatorcontrib><creatorcontrib>Narayanan, Krishna R</creatorcontrib><title>Group Testing using left-and-right-regular sparse-graph codes</title><description>We consider the problem of non-adaptive group testing of $N$ items out of
which $K$ or less items are known to be defective. We propose a testing scheme
based on left-and-right-regular sparse-graph codes and a simple iterative
decoder. We show that for any arbitrarily small $\epsilon>0$ our scheme
requires only $m=c_\epsilon K\log \frac{c_1N}{K}$ tests to recover
$(1-\epsilon)$ fraction of the defective items with high probability (w.h.p)
i.e., with probability approaching $1$ asymptotically in $N$ and $K$, where the
value of constants $c_\epsilon$ and $\ell$ are a function of the desired error
floor $\epsilon$ and constant $c_1=\frac{\ell}{c_\epsilon}$ (observed to be
approximately equal to 1 for various values of $\epsilon$). More importantly
the iterative decoding algorithm has a sub-linear computational complexity of
$\mathcal{O}(K\log \frac{N}{K})$ which is known to be optimal. Also for $m=c_2
K\log K\log \frac{N}{K}$ tests our scheme recovers the \textit{whole} set of
defective items w.h.p. These results are valid for both noiseless and noisy
versions of the problem as long as the number of defective items scale
sub-linearly with the total number of items, i.e., $K=o(N)$. The simulation
results validate the theoretical results by showing a substantial improvement
in the number of tests required when compared to the testing scheme based on
left-regular sparse-graphs.</description><subject>Computer Science - Information Theory</subject><subject>Mathematics - Information Theory</subject><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>GOX</sourceid><recordid>eNotj71OwzAUhb0woMIDMJEXcPBP3OsMHVAFBakSS_boxtdOI6VtdJ0geHtoYTnnTJ_OJ8SDVmXlnVNPyF_DZ6lB6VJBBXArNjs-L1PRxDwPp75Y8iXHmGaJJ5I89IdZcuyXEbnIE3KOsmecDkU4U8x34ibhmOP9f69E8_rSbN_k_mP3vn3eS1wDSEedDaa2Jna0Np4ggk6GAinTGR8CebIOalUnVWuDmH63Ix9shU53DuxKPP5hr__biYcj8nd78WivHvYHVK1DAA</recordid><startdate>20170125</startdate><enddate>20170125</enddate><creator>Vem, Avinash</creator><creator>Janakiraman, Nagaraj T</creator><creator>Narayanan, Krishna R</creator><scope>AKY</scope><scope>AKZ</scope><scope>GOX</scope></search><sort><creationdate>20170125</creationdate><title>Group Testing using left-and-right-regular sparse-graph codes</title><author>Vem, Avinash ; Janakiraman, Nagaraj T ; Narayanan, Krishna R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a677-5db3c2932ebd628d7e71f2dcd02b28ccd8d357909f0912aaf7905d8c34a51b573</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Computer Science - Information Theory</topic><topic>Mathematics - Information Theory</topic><toplevel>online_resources</toplevel><creatorcontrib>Vem, Avinash</creatorcontrib><creatorcontrib>Janakiraman, Nagaraj T</creatorcontrib><creatorcontrib>Narayanan, Krishna R</creatorcontrib><collection>arXiv Computer Science</collection><collection>arXiv Mathematics</collection><collection>arXiv.org</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Vem, Avinash</au><au>Janakiraman, Nagaraj T</au><au>Narayanan, Krishna R</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Group Testing using left-and-right-regular sparse-graph codes</atitle><date>2017-01-25</date><risdate>2017</risdate><abstract>We consider the problem of non-adaptive group testing of $N$ items out of
which $K$ or less items are known to be defective. We propose a testing scheme
based on left-and-right-regular sparse-graph codes and a simple iterative
decoder. We show that for any arbitrarily small $\epsilon>0$ our scheme
requires only $m=c_\epsilon K\log \frac{c_1N}{K}$ tests to recover
$(1-\epsilon)$ fraction of the defective items with high probability (w.h.p)
i.e., with probability approaching $1$ asymptotically in $N$ and $K$, where the
value of constants $c_\epsilon$ and $\ell$ are a function of the desired error
floor $\epsilon$ and constant $c_1=\frac{\ell}{c_\epsilon}$ (observed to be
approximately equal to 1 for various values of $\epsilon$). More importantly
the iterative decoding algorithm has a sub-linear computational complexity of
$\mathcal{O}(K\log \frac{N}{K})$ which is known to be optimal. Also for $m=c_2
K\log K\log \frac{N}{K}$ tests our scheme recovers the \textit{whole} set of
defective items w.h.p. These results are valid for both noiseless and noisy
versions of the problem as long as the number of defective items scale
sub-linearly with the total number of items, i.e., $K=o(N)$. The simulation
results validate the theoretical results by showing a substantial improvement
in the number of tests required when compared to the testing scheme based on
left-regular sparse-graphs.</abstract><doi>10.48550/arxiv.1701.07477</doi><oa>free_for_read</oa></addata></record> |
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subjects | Computer Science - Information Theory Mathematics - Information Theory |
title | Group Testing using left-and-right-regular sparse-graph codes |
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