Increased low-temperature damping in yttrium iron garnet thin films
We report measurements of the frequency and temperature dependence of ferromagnetic resonance (FMR) for a 15-nm-thick yttrium iron garnet (YIG) film grown by off-axis sputtering. Although the FMR linewidth is narrow at room temperature (corresponding to a damping coefficient \(\alpha\) = (9.0 \(\pm\...
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creator | Jermain, C L Aradhya, S V Brangham, J T Page, M R Reynolds, N D Hammel, P C Buhrman, R A Yang, F Y Ralph, D C |
description | We report measurements of the frequency and temperature dependence of ferromagnetic resonance (FMR) for a 15-nm-thick yttrium iron garnet (YIG) film grown by off-axis sputtering. Although the FMR linewidth is narrow at room temperature (corresponding to a damping coefficient \(\alpha\) = (9.0 \(\pm\) 0.2) \(\times 10^{-4}\)), comparable to previous results for high-quality YIG films of similar thickness, the linewidth increases strongly at low temperatures, by a factor of almost 30. This increase cannot be explained as due to two-magnon scattering from defects at the sample interfaces. We argue that the increased low-temperature linewidth is due to impurity relaxation mechanisms that have been investigated previously in bulk YIG samples. We suggest that the low-temperature linewidth is a useful figure of merit to guide the optimization of thin-film growth protocols because it is a particularly sensitive indicator of impurities. |
doi_str_mv | 10.48550/arxiv.1612.01954 |
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Although the FMR linewidth is narrow at room temperature (corresponding to a damping coefficient \(\alpha\) = (9.0 \(\pm\) 0.2) \(\times 10^{-4}\)), comparable to previous results for high-quality YIG films of similar thickness, the linewidth increases strongly at low temperatures, by a factor of almost 30. This increase cannot be explained as due to two-magnon scattering from defects at the sample interfaces. We argue that the increased low-temperature linewidth is due to impurity relaxation mechanisms that have been investigated previously in bulk YIG samples. We suggest that the low-temperature linewidth is a useful figure of merit to guide the optimization of thin-film growth protocols because it is a particularly sensitive indicator of impurities.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.1612.01954</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Damping ; Ferromagnetic materials ; Ferromagnetic resonance ; Figure of merit ; Film growth ; Impurities ; Iron ; Magnons ; Optimization ; Physics - Mesoscale and Nanoscale Physics ; Temperature ; Temperature dependence ; Thickness ; Thin films ; Yttrium ; Yttrium-iron garnet</subject><ispartof>arXiv.org, 2016-12</ispartof><rights>2016. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). 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Although the FMR linewidth is narrow at room temperature (corresponding to a damping coefficient \(\alpha\) = (9.0 \(\pm\) 0.2) \(\times 10^{-4}\)), comparable to previous results for high-quality YIG films of similar thickness, the linewidth increases strongly at low temperatures, by a factor of almost 30. This increase cannot be explained as due to two-magnon scattering from defects at the sample interfaces. We argue that the increased low-temperature linewidth is due to impurity relaxation mechanisms that have been investigated previously in bulk YIG samples. We suggest that the low-temperature linewidth is a useful figure of merit to guide the optimization of thin-film growth protocols because it is a particularly sensitive indicator of impurities.</description><subject>Damping</subject><subject>Ferromagnetic materials</subject><subject>Ferromagnetic resonance</subject><subject>Figure of merit</subject><subject>Film growth</subject><subject>Impurities</subject><subject>Iron</subject><subject>Magnons</subject><subject>Optimization</subject><subject>Physics - Mesoscale and Nanoscale Physics</subject><subject>Temperature</subject><subject>Temperature dependence</subject><subject>Thickness</subject><subject>Thin films</subject><subject>Yttrium</subject><subject>Yttrium-iron garnet</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GOX</sourceid><recordid>eNotj8tOwzAURC0kJKrSD2CFJdYJfsbOEkU8KlVi033k2NfFVV44DtC_J7SsZjFHozkI3VGSCy0leTTxJ3zltKAsJ7SU4gqtGOc004KxG7SZpiMhhBWKSclXqNr2NoKZwOF2-M4SdCNEk-YI2JluDP0Bhx6fUoph7nCIQ48PJvaQcPpYCh_abrpF1960E2z-c432L8_76i3bvb9uq6ddZiQTWaMb8AJEAR6aRpXOKk-IBmOdVlp7K4Eza42i0FgPnpJClIIr6QQtHHN8je4vs2fDeoyhM_FU_5nWZ9OFeLgQYxw-Z5hSfRzm2C-fakaUKLUSSvBfQDRX2g</recordid><startdate>20161206</startdate><enddate>20161206</enddate><creator>Jermain, C L</creator><creator>Aradhya, S V</creator><creator>Brangham, J T</creator><creator>Page, M R</creator><creator>Reynolds, N D</creator><creator>Hammel, P C</creator><creator>Buhrman, R A</creator><creator>Yang, F Y</creator><creator>Ralph, D C</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>GOX</scope></search><sort><creationdate>20161206</creationdate><title>Increased low-temperature damping in yttrium iron garnet thin films</title><author>Jermain, C L ; 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Although the FMR linewidth is narrow at room temperature (corresponding to a damping coefficient \(\alpha\) = (9.0 \(\pm\) 0.2) \(\times 10^{-4}\)), comparable to previous results for high-quality YIG films of similar thickness, the linewidth increases strongly at low temperatures, by a factor of almost 30. This increase cannot be explained as due to two-magnon scattering from defects at the sample interfaces. We argue that the increased low-temperature linewidth is due to impurity relaxation mechanisms that have been investigated previously in bulk YIG samples. We suggest that the low-temperature linewidth is a useful figure of merit to guide the optimization of thin-film growth protocols because it is a particularly sensitive indicator of impurities.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><doi>10.48550/arxiv.1612.01954</doi><oa>free_for_read</oa></addata></record> |
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subjects | Damping Ferromagnetic materials Ferromagnetic resonance Figure of merit Film growth Impurities Iron Magnons Optimization Physics - Mesoscale and Nanoscale Physics Temperature Temperature dependence Thickness Thin films Yttrium Yttrium-iron garnet |
title | Increased low-temperature damping in yttrium iron garnet thin films |
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