X-Ray Thomson scattering without the Chihara decomposition

X-Ray Thomson Scattering (XRTS) is an important experimental technique used to measure the temperature, ionization state, structure, and density of warm dense matter (WDM). The fundamental property probed in these experiments is the electronic dynamic structure factor (DSF). In most models, this is...

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Veröffentlicht in:	arXiv.org 2016-04
Hauptverfasser:	Baczewski, Andrew D, Shulenburger, Luke, Desjarlais, Michael P, Hansen, Stephanie B, Magyar, Rudolph J
Format:	Artikel
Sprache:	eng
Schlagworte:	Beryllium Decomposition Density functional theory First principles Free electrons Ionization Physics - Chemical Physics Physics - Computational Physics Physics - Materials Science Physics - Plasma Physics Structure factor Temperature dependence Thomson scattering Time dependence
Online-Zugang:	Volltext
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