Error Compensation of Single-Qubit Gates in a Surface Electrode Ion Trap Using Composite Pulses

The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, w...

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Veröffentlicht in:arXiv.org 2015-07
Hauptverfasser: Mount, Emily, Kabytayev, Chingiz, Crain, Stephen, Harper, Robin, So-Young, Baek, Vrijsen, Geert, Flammia, Steven, Brown, Kenneth R, Maunz, Peter, Kim, Jungsang
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creator Mount, Emily
Kabytayev, Chingiz
Crain, Stephen
Harper, Robin
So-Young, Baek
Vrijsen, Geert
Flammia, Steven
Brown, Kenneth R
Maunz, Peter
Kim, Jungsang
description The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high fidelity single-qubit gates for the hyperfine qubit of a \(^{171}\text{Yb}^+\) ion trapped in a microfabricated surface electrode ion trap. Gate error is characterized using a randomized benchmarking protocol, and an average error per randomized Clifford group gate of \(3.6(3)\times10^{-4}\) is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.
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subjects Electrodes
Error compensation
Ions
Physics - Quantum Physics
Qubits (quantum computing)
Randomization
title Error Compensation of Single-Qubit Gates in a Surface Electrode Ion Trap Using Composite Pulses
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