Carrier Lifetime Enhancement in a Tellurium Nanowire/PEDOT:PSS Nanocomposite by Sulfur Passivation
We report static and time-resolved terahertz (THz) conductivity measurements of a high- performance thermoelectric material containing tellurium nanowires in a PEDOT:PSS matrix. Composites were made with and without sulfur passivation of the nanowires surfaces. The material with sulfur linkers (TeNW...
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| creator | Heyman, James N Sahu, Ayaskanta Coates, Nelson E Ehmann, Brittany Urban, Jeffery J |
| description | We report static and time-resolved terahertz (THz) conductivity measurements
of a high- performance thermoelectric material containing tellurium nanowires
in a PEDOT:PSS matrix. Composites were made with and without sulfur passivation
of the nanowires surfaces. The material with sulfur linkers (TeNW/PD-S) is less
conductive but has a longer carrier lifetime than the formulation without
(TeNW/PD). We find real conductivities at f = 1THz of {\sigma}(TeNW/PD) = 160
S/cm and {\sigma}(TeNW/PD-S) = 5.1 S/cm. These values are much larger than the
corresponding DC conductivities, suggesting DC conductivity is limited by
structural defects. The free-carrier lifetime in the nanowires is controlled by
recombination and trapping at the nanowire surfaces. We find surface
recombination velocities in bare tellurium nanowires (22m/s) and TeNW/PD-S
(40m/s) that are comparable to evaporated tellurium thin films. The surface
recombination velocity in TeNW/PD (509m/s) is much larger, indicating a higher
interface trap density. |
| doi_str_mv | 10.48550/arxiv.1411.5914 |
| format | Article |
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of a high- performance thermoelectric material containing tellurium nanowires
in a PEDOT:PSS matrix. Composites were made with and without sulfur passivation
of the nanowires surfaces. The material with sulfur linkers (TeNW/PD-S) is less
conductive but has a longer carrier lifetime than the formulation without
(TeNW/PD). We find real conductivities at f = 1THz of {\sigma}(TeNW/PD) = 160
S/cm and {\sigma}(TeNW/PD-S) = 5.1 S/cm. These values are much larger than the
corresponding DC conductivities, suggesting DC conductivity is limited by
structural defects. The free-carrier lifetime in the nanowires is controlled by
recombination and trapping at the nanowire surfaces. We find surface
recombination velocities in bare tellurium nanowires (22m/s) and TeNW/PD-S
(40m/s) that are comparable to evaporated tellurium thin films. The surface
recombination velocity in TeNW/PD (509m/s) is much larger, indicating a higher
interface trap density.</description><identifier>DOI: 10.48550/arxiv.1411.5914</identifier><language>eng</language><subject>Physics - Materials Science</subject><creationdate>2014-11</creationdate><rights>http://arxiv.org/licenses/nonexclusive-distrib/1.0</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>228,230,780,885</link.rule.ids><linktorsrc>$$Uhttps://arxiv.org/abs/1411.5914$$EView_record_in_Cornell_University$$FView_record_in_$$GCornell_University$$Hfree_for_read</linktorsrc><backlink>$$Uhttps://doi.org/10.48550/arXiv.1411.5914$$DView paper in arXiv$$Hfree_for_read</backlink></links><search><creatorcontrib>Heyman, James N</creatorcontrib><creatorcontrib>Sahu, Ayaskanta</creatorcontrib><creatorcontrib>Coates, Nelson E</creatorcontrib><creatorcontrib>Ehmann, Brittany</creatorcontrib><creatorcontrib>Urban, Jeffery J</creatorcontrib><title>Carrier Lifetime Enhancement in a Tellurium Nanowire/PEDOT:PSS Nanocomposite by Sulfur Passivation</title><description>We report static and time-resolved terahertz (THz) conductivity measurements
of a high- performance thermoelectric material containing tellurium nanowires
in a PEDOT:PSS matrix. Composites were made with and without sulfur passivation
of the nanowires surfaces. The material with sulfur linkers (TeNW/PD-S) is less
conductive but has a longer carrier lifetime than the formulation without
(TeNW/PD). We find real conductivities at f = 1THz of {\sigma}(TeNW/PD) = 160
S/cm and {\sigma}(TeNW/PD-S) = 5.1 S/cm. These values are much larger than the
corresponding DC conductivities, suggesting DC conductivity is limited by
structural defects. The free-carrier lifetime in the nanowires is controlled by
recombination and trapping at the nanowire surfaces. We find surface
recombination velocities in bare tellurium nanowires (22m/s) and TeNW/PD-S
(40m/s) that are comparable to evaporated tellurium thin films. The surface
recombination velocity in TeNW/PD (509m/s) is much larger, indicating a higher
interface trap density.</description><subject>Physics - Materials Science</subject><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>GOX</sourceid><recordid>eNotzz1vgzAUhWEvHaq0e6fKfwCCwZeYbhWlHxJqkGBH1-RatYRNZCBt_n2VtNOR3uFID2MPIomlAki2GH7sKRZSiBgKIW-ZLjEES4HX1tBiHfHKf6EfyJFfuPUceUfjuAa7Ov6Jfvq2gbZN9bLvnpq2vaZhcsdptgtxfebtOpo18Abn2Z5wsZO_YzcGx5nu_3fDuteqK9-jev_2UT7XEeYgIwQSlMpCgDKglBA60SqVZoeZlIqSFAeSBwOEKZkCDGC-K4Y8BS2UIn3INuzx7_Zq7I_BOgzn_mLtL9bsF9P3T7s</recordid><startdate>20141121</startdate><enddate>20141121</enddate><creator>Heyman, James N</creator><creator>Sahu, Ayaskanta</creator><creator>Coates, Nelson E</creator><creator>Ehmann, Brittany</creator><creator>Urban, Jeffery J</creator><scope>GOX</scope></search><sort><creationdate>20141121</creationdate><title>Carrier Lifetime Enhancement in a Tellurium Nanowire/PEDOT:PSS Nanocomposite by Sulfur Passivation</title><author>Heyman, James N ; Sahu, Ayaskanta ; Coates, Nelson E ; Ehmann, Brittany ; Urban, Jeffery J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a654-a5e1e249158f58811b0b824f7a3448e02ace4df5ea2ef95f5a679c625b188ebd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Physics - Materials Science</topic><toplevel>online_resources</toplevel><creatorcontrib>Heyman, James N</creatorcontrib><creatorcontrib>Sahu, Ayaskanta</creatorcontrib><creatorcontrib>Coates, Nelson E</creatorcontrib><creatorcontrib>Ehmann, Brittany</creatorcontrib><creatorcontrib>Urban, Jeffery J</creatorcontrib><collection>arXiv.org</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Heyman, James N</au><au>Sahu, Ayaskanta</au><au>Coates, Nelson E</au><au>Ehmann, Brittany</au><au>Urban, Jeffery J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Carrier Lifetime Enhancement in a Tellurium Nanowire/PEDOT:PSS Nanocomposite by Sulfur Passivation</atitle><date>2014-11-21</date><risdate>2014</risdate><abstract>We report static and time-resolved terahertz (THz) conductivity measurements
of a high- performance thermoelectric material containing tellurium nanowires
in a PEDOT:PSS matrix. Composites were made with and without sulfur passivation
of the nanowires surfaces. The material with sulfur linkers (TeNW/PD-S) is less
conductive but has a longer carrier lifetime than the formulation without
(TeNW/PD). We find real conductivities at f = 1THz of {\sigma}(TeNW/PD) = 160
S/cm and {\sigma}(TeNW/PD-S) = 5.1 S/cm. These values are much larger than the
corresponding DC conductivities, suggesting DC conductivity is limited by
structural defects. The free-carrier lifetime in the nanowires is controlled by
recombination and trapping at the nanowire surfaces. We find surface
recombination velocities in bare tellurium nanowires (22m/s) and TeNW/PD-S
(40m/s) that are comparable to evaporated tellurium thin films. The surface
recombination velocity in TeNW/PD (509m/s) is much larger, indicating a higher
interface trap density.</abstract><doi>10.48550/arxiv.1411.5914</doi><oa>free_for_read</oa></addata></record> |
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| subjects | Physics - Materials Science |
| title | Carrier Lifetime Enhancement in a Tellurium Nanowire/PEDOT:PSS Nanocomposite by Sulfur Passivation |
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