Shaping electron beams for the generation of innovative measurements in the (S)TEM
In TEM, a typical goal consists of making a small electron probe in the sample plane in order to obtain high spatial resolution in scanning transmission electron microscopy. In order to do so, the phase of the electron wave is corrected to resemble a spherical wave compensating for aberrations in th...
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| creator | Verbeeck, Jo Guzzinati, Giulio Clark, Laura Juchtmans, Roeland Ruben Van Boxem He, Tian Béché, Armand Lubk, Axel Gustaaf Van Tendeloo |
| description | In TEM, a typical goal consists of making a small electron probe in the sample plane in order to obtain high spatial resolution in scanning transmission electron microscopy. In order to do so, the phase of the electron wave is corrected to resemble a spherical wave compensating for aberrations in the magnetic lenses. In this contribution we discuss the advantage of changing the phase of an electron wave in a specific way in order to obtain fundamentally different electron probes opening up new application in the (S)TEM. We focus on electron vortex states as a specific family of waves with an azimuthal phase signature and discuss their properties, production and applications. The concepts presented here are rather general and also different classes of probes can be obtained in a similar fashion showing that electron probes can be tuned to optimise a specific measurement or interaction. |
| doi_str_mv | 10.48550/arxiv.1403.5457 |
| format | Article |
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| subjects | Electron beams Electron probes Magnetic lenses Physics - Materials Science Physics - Optics Scanning electron microscopy Scanning transmission electron microscopy Spatial resolution Spherical waves Transmission electron microscopy |
| title | Shaping electron beams for the generation of innovative measurements in the (S)TEM |
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