EDEPR of impurity centers embedded in silicon microcavities
We present the first findings of the new electrically-detected EPR (EDEPR) technique which reveal different shallow and deep centers without using the external cavity as well as the hf source and recorder, with measuring the only magnetoresistance of the Si-QW confined by the superconductor delta-ba...
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| Veröffentlicht in: | arXiv.org 2009-10 |
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| creator | Bagraev, N T Gehlhoff, W Gets, D S Klyachkin, L E Kudryavtsev, A A Malyarenko, A M Mashkov, V A Romanov, V V |
| description | We present the first findings of the new electrically-detected EPR (EDEPR) technique which reveal different shallow and deep centers without using the external cavity as well as the hf source and recorder, with measuring the only magnetoresistance of the Si-QW confined by the superconductor delta-barriers. |
| doi_str_mv | 10.48550/arxiv.0910.3851 |
| format | Article |
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| language | eng |
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| source | arXiv.org; Free E- Journals |
| subjects | Magnetoresistance Magnetoresistivity Microcavities Physics - Mesoscale and Nanoscale Physics Physics - Superconductivity Silicon |
| title | EDEPR of impurity centers embedded in silicon microcavities |
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