Measurements of Surface Diffusivity and Coarsening During Pulsed Laser Deposition
Pulsed Laser Deposition (PLD) of homoepitaxial SrTiO3 was studied with in-situ x-ray specular reflectivity and surface diffuse x-ray scattering. Unlike prior reflectivity-based studies, these measurements access both the time- and the length-scales of the evolution of the surface morphology during g...
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creator | Ferguson, J D Arikan, G Dale, D S Woll, A R Brock, J D |
description | Pulsed Laser Deposition (PLD) of homoepitaxial SrTiO3 was studied with in-situ x-ray specular reflectivity and surface diffuse x-ray scattering. Unlike prior reflectivity-based studies, these measurements access both the time- and the length-scales of the evolution of the surface morphology during growth. In particular, we show that this technique allows direct measurements of the diffusivity for both inter- and intra-layer transport. Our results explicitly limit the possible role of island break-up, demonstrate the key roles played by nucleation and coarsening in PLD, and place an upper bound on the Ehrlich-Schwoebel (ES) barrier for downhill diffusion. |
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subjects | Coarsening Diffusion barriers Diffusivity Morphology Nucleation Physics - Materials Science Pulsed laser deposition Pulsed lasers Reflectance Strontium titanates Upper bounds X-ray scattering |
title | Measurements of Surface Diffusivity and Coarsening During Pulsed Laser Deposition |
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