Contact-Resistance-Free Stretchable Strain Sensors with High Repeatability and Linearity

Most of the existing stretchable strain sensors are based on the contact-resistance mechanism, where the stretchability and resistance variation depend on the change of the contact relationship of the conductive microstructures. These sensors usually exhibit large sensing ranges and gauge factors bu...

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Veröffentlicht in:ACS nano 2022-01, Vol.16 (1), p.541-553
Hauptverfasser: Li, Shuang, Liu, Guodong, Li, Rui, Li, Qinlan, Zhao, Yang, Huang, Mingqi, Zhang, Maoyi, Yin, Shizhen, Zhou, Yixin, Tang, Hao, Wang, Liwu, Fang, Guanhui, Su, Yewang
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container_title ACS nano
container_volume 16
creator Li, Shuang
Liu, Guodong
Li, Rui
Li, Qinlan
Zhao, Yang
Huang, Mingqi
Zhang, Maoyi
Yin, Shizhen
Zhou, Yixin
Tang, Hao
Wang, Liwu
Fang, Guanhui
Su, Yewang
description Most of the existing stretchable strain sensors are based on the contact-resistance mechanism, where the stretchability and resistance variation depend on the change of the contact relationship of the conductive microstructures. These sensors usually exhibit large sensing ranges and gauge factors but unsatisfactory repeatability and linearity of the electrical responses because the contact is unstable. Here, we report a completely different design for stretchable strain sensors based on a contact-resistance-free structure, i.e., the off-axis serpentine sandwich structure (OASSS), with the mechanism of the stretch–bending–stretch transformation (SBST). Neither unstable contact resistance nor nonlinear constitutive and geometric behaviors occur for the OASSS while the sensor undergoes a large applied strain (50%), which guarantees high repeatability (repeatability error = 1.58%) and linearity (goodness-of-fit >0.999). Owing to such performances, the present sensors are not only applied to monitoring human activities and medical surgery but also to the ground tests of Tianwen-1, China’s first Mars exploration mission.
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title Contact-Resistance-Free Stretchable Strain Sensors with High Repeatability and Linearity
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