Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor

Transient faults due to neutron and alpha particle strikes posea significant obstacle to increasing processor transistor counts infuture technologies. Although fault rates of individual transistorsmay not rise significantly, incorporating more transistors into adevice makes that device more likely t...

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Hauptverfasser:	Weaver, Christopher, Emer, Joel, Mukherjee, Shubhendu S., Reinhardt, Steven K.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Applied sciences Computer systems organization Computer systems organization > Dependable and fault-tolerant systems and networks Electronics Exact sciences and technology General and reference General and reference > Cross-computing tools and techniques General and reference > Cross-computing tools and techniques > Performance Integrated circuits Integrated circuits by function (including memories and processors) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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