Leakage aware dynamic voltage scaling for real-time embedded systems
A five-fold increase in leakage current is predicted with each technology generation. While Dynamic Voltage Scaling (DVS) is known to reduce dynamic power consumption, it also causes increased leakage energy drain by lengthening the interval over which a computation is carried out. Therefore, for mi...
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creator | Jejurikar, Ravindra Pereira, Cristiano Gupta, Rajesh |
description | A five-fold increase in leakage current is predicted with each technology generation. While Dynamic Voltage Scaling (DVS) is known to reduce dynamic power consumption, it also causes increased leakage energy drain by lengthening the interval over which a computation is carried out. Therefore, for minimization of the total energy, one needs to determine an operating point, called the critical speed. We compute processor slowdown factors based on the critical speed for energy minimization. Procrastination scheduling attempts to maximize the duration of idle intervals by keeping the processor in a sleep/shutdown state even if there are pending tasks, within the constraints imposed by performance requirements. Our simulation experiments show that the critical speed slowdown results in up to 5% energy gains over a leakage oblivious dynamic voltage scaling. Procrastination scheduling scheme extends the sleep intervals to up to 5 times, resulting in up to an additional 18% energy gains, while meeting all timing requirements. |
doi_str_mv | 10.1145/996566.996650 |
format | Conference Proceeding |
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While Dynamic Voltage Scaling (DVS) is known to reduce dynamic power consumption, it also causes increased leakage energy drain by lengthening the interval over which a computation is carried out. Therefore, for minimization of the total energy, one needs to determine an operating point, called the critical speed. We compute processor slowdown factors based on the critical speed for energy minimization. Procrastination scheduling attempts to maximize the duration of idle intervals by keeping the processor in a sleep/shutdown state even if there are pending tasks, within the constraints imposed by performance requirements. Our simulation experiments show that the critical speed slowdown results in up to 5% energy gains over a leakage oblivious dynamic voltage scaling. Procrastination scheduling scheme extends the sleep intervals to up to 5 times, resulting in up to an additional 18% energy gains, while meeting all timing requirements.</description><identifier>ISSN: 0738-100X</identifier><identifier>ISBN: 1581138288</identifier><identifier>ISBN: 9781581138283</identifier><identifier>ISBN: 1511838288</identifier><identifier>DOI: 10.1145/996566.996650</identifier><language>eng</language><publisher>New York, NY, USA: ACM</publisher><subject>Applied sciences ; CMOS technology ; Design. Technologies. Operation analysis. Testing ; Dynamic voltage scaling ; Electronics ; Embedded system ; Energy consumption ; Exact sciences and technology ; Integrated circuits ; Integrated circuits by function (including memories and processors) ; Minimization ; Processor scheduling ; Real time systems ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Software and its engineering -- Software organization and properties -- Contextual software domains -- Operating systems -- Process management -- Scheduling ; Subthreshold current ; Threshold voltage ; Voltage control</subject><ispartof>Proceedings of the 41st annual Design Automation Conference, 2004, p.275-280</ispartof><rights>2004 ACM</rights><rights>2006 INIST-CNRS</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a354t-5e5292b5fb18c936b17791d3e9434101c5eb41829bc764a231138ebda609f4073</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1322489$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,796,4050,4051,23930,23931,25140,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1322489$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17345478$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Jejurikar, Ravindra</creatorcontrib><creatorcontrib>Pereira, Cristiano</creatorcontrib><creatorcontrib>Gupta, Rajesh</creatorcontrib><title>Leakage aware dynamic voltage scaling for real-time embedded systems</title><title>Proceedings of the 41st annual Design Automation Conference</title><addtitle>DAC</addtitle><description>A five-fold increase in leakage current is predicted with each technology generation. While Dynamic Voltage Scaling (DVS) is known to reduce dynamic power consumption, it also causes increased leakage energy drain by lengthening the interval over which a computation is carried out. Therefore, for minimization of the total energy, one needs to determine an operating point, called the critical speed. We compute processor slowdown factors based on the critical speed for energy minimization. Procrastination scheduling attempts to maximize the duration of idle intervals by keeping the processor in a sleep/shutdown state even if there are pending tasks, within the constraints imposed by performance requirements. Our simulation experiments show that the critical speed slowdown results in up to 5% energy gains over a leakage oblivious dynamic voltage scaling. Procrastination scheduling scheme extends the sleep intervals to up to 5 times, resulting in up to an additional 18% energy gains, while meeting all timing requirements.</description><subject>Applied sciences</subject><subject>CMOS technology</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Dynamic voltage scaling</subject><subject>Electronics</subject><subject>Embedded system</subject><subject>Energy consumption</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>Integrated circuits by function (including memories and processors)</subject><subject>Minimization</subject><subject>Processor scheduling</subject><subject>Real time systems</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Software and its engineering -- Software organization and properties -- Contextual software domains -- Operating systems -- Process management -- Scheduling</subject><subject>Subthreshold current</subject><subject>Threshold voltage</subject><subject>Voltage control</subject><issn>0738-100X</issn><isbn>1581138288</isbn><isbn>9781581138283</isbn><isbn>1511838288</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNqNkM1LxDAQxQMquK579OSlFz3ZNdMkbXKU9RMWvCh4C5N0utRtt0tSlP3vbang1bk8mPdjmPcYuwC-BJDq1phc5flykFzxI3YGSgMInWl9zGa8EDoFzj9O2SLGTz5MUZhCihm7XxNucUMJfmOgpDzssK198tU1_biNHpt6t0mqLiSBsEn7uqWEWkdlSWUSD7GnNp6zkwqbSItfnbP3x4e31XO6fn16Wd2tUxRK9qkilZnMqcqB9kbkDoYvoBRkpJDAwStyEnRmnC9yiZkYE5ArMeemkkOIObua7u5xfKwKuPN1tPtQtxgOFgohlSz0wF1OXE1Ef7bIMqnN4N5MLvrWuq7bRgvcji3aqUU7tWhdqKka8Ot_4eIHRR1t8A</recordid><startdate>20040607</startdate><enddate>20040607</enddate><creator>Jejurikar, Ravindra</creator><creator>Pereira, Cristiano</creator><creator>Gupta, Rajesh</creator><general>ACM</general><general>IEEE</general><general>Association for Computing Machinery</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>IQODW</scope></search><sort><creationdate>20040607</creationdate><title>Leakage aware dynamic voltage scaling for real-time embedded systems</title><author>Jejurikar, Ravindra ; Pereira, Cristiano ; Gupta, Rajesh</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a354t-5e5292b5fb18c936b17791d3e9434101c5eb41829bc764a231138ebda609f4073</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Applied sciences</topic><topic>CMOS technology</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Dynamic voltage scaling</topic><topic>Electronics</topic><topic>Embedded system</topic><topic>Energy consumption</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>Integrated circuits by function (including memories and processors)</topic><topic>Minimization</topic><topic>Processor scheduling</topic><topic>Real time systems</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Software and its engineering -- Software organization and properties -- Contextual software domains -- Operating systems -- Process management -- Scheduling</topic><topic>Subthreshold current</topic><topic>Threshold voltage</topic><topic>Voltage control</topic><toplevel>online_resources</toplevel><creatorcontrib>Jejurikar, Ravindra</creatorcontrib><creatorcontrib>Pereira, Cristiano</creatorcontrib><creatorcontrib>Gupta, Rajesh</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jejurikar, Ravindra</au><au>Pereira, Cristiano</au><au>Gupta, Rajesh</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Leakage aware dynamic voltage scaling for real-time embedded systems</atitle><btitle>Proceedings of the 41st annual Design Automation Conference</btitle><stitle>DAC</stitle><date>2004-06-07</date><risdate>2004</risdate><spage>275</spage><epage>280</epage><pages>275-280</pages><issn>0738-100X</issn><isbn>1581138288</isbn><isbn>9781581138283</isbn><isbn>1511838288</isbn><abstract>A five-fold increase in leakage current is predicted with each technology generation. While Dynamic Voltage Scaling (DVS) is known to reduce dynamic power consumption, it also causes increased leakage energy drain by lengthening the interval over which a computation is carried out. Therefore, for minimization of the total energy, one needs to determine an operating point, called the critical speed. We compute processor slowdown factors based on the critical speed for energy minimization. Procrastination scheduling attempts to maximize the duration of idle intervals by keeping the processor in a sleep/shutdown state even if there are pending tasks, within the constraints imposed by performance requirements. Our simulation experiments show that the critical speed slowdown results in up to 5% energy gains over a leakage oblivious dynamic voltage scaling. Procrastination scheduling scheme extends the sleep intervals to up to 5 times, resulting in up to an additional 18% energy gains, while meeting all timing requirements.</abstract><cop>New York, NY, USA</cop><pub>ACM</pub><doi>10.1145/996566.996650</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Applied sciences CMOS technology Design. Technologies. Operation analysis. Testing Dynamic voltage scaling Electronics Embedded system Energy consumption Exact sciences and technology Integrated circuits Integrated circuits by function (including memories and processors) Minimization Processor scheduling Real time systems Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Software and its engineering -- Software organization and properties -- Contextual software domains -- Operating systems -- Process management -- Scheduling Subthreshold current Threshold voltage Voltage control |
title | Leakage aware dynamic voltage scaling for real-time embedded systems |
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