In-field aging measurement and calibration for power-performance optimization

Aging of transistors has become a major reliability concern especially when the VLSI circuits are in the nanometer regime. In this paper, we propose a novel methodology to address circuit aging in the field. On-chip aging sensor is designed to monitor transitions on functional paths capturing functi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Wang, Shuo, Tehranipoor, Mohammad, Winemberg, LeRoy
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Aging Calibration Clocks Hardware > Robustness Monitoring On-chip measurement Path delay measurement Performance calibration Power-performance optimization Pulse measurements Timing
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