Electrical assessment of copper damascene interconnects down to sub-50 nm feature sizes von Steinlesberger, G., Engelhardt, M., Schindler, G., Steinhögl, W., von Glasow, A., Mosig, K., Bertagnolli, E.

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Investigation of via-dominated multi-modal electromigration failure distributions in dual damascene Cu interconnects with a discussion of the statistical implications von Gill, J., Sullivan, T., Yankee, S., Barth, H., von Glasow, A.

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Modeling bimodal electromigration failure distributions von Fischer, A.H, Abel, A, Lepper, M, Zitzelsberger, A.E, von Glasow, A

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Crystal Texture and Electromigration Damage in Al-Based Interconnect Lines Studied by ACOM with the SEM von Schwarzer, Robert A., Lepper, M., von Glasow, A., Piscevic, D.

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Electromigration failure mechanism studies on copper interconnects von Fischer, A.H., von Glasow, A., Penka, S., Ungar, F.

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New approaches for the assessment of stress-induced voiding in Cu interconnects von von Glasow, A., Fischer, A.H.

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Process optimization-the key to obtain highly reliable Cu interconnects von Fischer, A.H., von Glasow, A., Penka, S., Ungar, F.

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Copper damascene interconnects for the 65 nm technology node: a first look at the reliability properties von Steinlesberger, G., von Glasow, A., Engelhardt, M., Schindler, G., Honlein, W., Holz, M., Bertagnolli, E.

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TDDB robustness of highly dense 65NM BEOL vertical natural capacitor with competitive area capacitance for RF and mixed-signal applications von Fischer, A.H., Lim, Y.K., Riess, P., Pompl, T., Zhang, B.C., Chua, E.C., Keller, W.W., Tan, J.B., Klee, V., Tan, Y.C., Souche, D., Sohn, D.K., von Glasow, A.

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Crystal texture and electromigration damage in Al-based interconnect lines studied by ACOM with the SEM von Lepper, M, von Glasow, A, Piscevic, D, Schwarzer, R A

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Experimental data and statistical models for bimodal EM failures von Fischer, A.H., Abel, A., Lepper, M., Zitzelsberger, A.E., von Glasow, A.

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Elektromigration schädigt Leitbahnen : In situ-Untersuchung im Rasterelektronenmikroskop von WETZIG, K, BUERKE, A, WENDROCK, H, VON GLASOW, A

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Modeling the gas and aqueous phase chemistry of the marine boundary layer

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Reactive halogen chemistry in the troposphere von Saiz-Lopez, Alfonso, von Glasow, Roland

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Tropospheric Halogen Chemistry: Sources, Cycling, and Impacts von Simpson, William R, Brown, Steven S, Saiz-Lopez, Alfonso, Thornton, Joel A, von Glasow, Roland

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The effects of volcanic eruptions on atmospheric chemistry von von Glasow, Roland, Bobrowski, Nicole, Kern, Christoph

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A global model of tropospheric chlorine chemistry: Organic versus inorganic sources and impact on methane oxidation von Hossaini, Ryan, Chipperfield, Martyn P., Saiz‐Lopez, Alfonso, Fernandez, Rafael, Monks, Sarah, Feng, Wuhu, Brauer, Peter, Glasow, Roland

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Atmospheric chemistry in volcanic plumes von von Glasow, Roland, Finlayson-Pitts, Barbara J.

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Growth in stratospheric chlorine from short-lived chemicals not controlled by the Montreal Protocol von Hossaini, R., Chipperfield, M. P., Saiz-Lopez, A., Harrison, J. J., von Glasow, R., Sommariva, R., Atlas, E., Navarro, M., Montzka, S. A., Feng, W., Dhomse, S., Harth, C., Mühle, J., Lunder, C., O'Doherty, S., Young, D., Reimann, S., Vollmer, M. K., Krummel, P. B., Bernath, P. F.

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1980–2010 Variability in U.K. Surface Wind Climate von Earl, Nick, Dorling, Steve, Hewston, Richard, von Glasow, Roland

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