Radiation hardness of gallium nitride von Ionascut-Nedelcescu, A., Carlone, C., Houdayer, A., von Bardeleben, H.J., Cantin, J.-L., Raymond, S.

Volltext

Multifunctional ZnO:V thin films deposited by rf-magnetron sputtering from aerogel nanopowder target material von El Mir, L., Ghribi, F., Hajiri, M., Ayadi, Z. Ben, Djessas, K., Cubukcu, M., von Bardeleben, H.J.

Volltext

Electron paramagnetic resonance study of Zn1–xCoxO: A predicted high-temperature ferromagnetic semiconductor von Jedrecy, Nathalie, von Bardeleben, H.J., Zheng, Yunlin Jacques, Cantin, J.-L.

Volltext

Identification of the Carbon Dangling Bond Center at the 4H-SiC=SiO2 Interface by an EPR Study in Oxidized Porous SiC von Cantin, Jean-Louis, von Bardeleben, J., Shishkin, Y., Ke, Y., P. Devaty, R., J. Choyke, W.

Volltext

Ferromagnetism in Ga0.90Mn0.10As1<ce:hsp sp="0.12"/>-<ce:hsp sp="0.12"/>yPy: From the metallic to the impurity band conduction regime von Cubukcu, M, von Bardeleben, HJ, Cantin, J L, Vickridge, I, Lemaitre, A

Volltext

Hydrogen passivation of carbon P-b like centers at the 3C-and 4H-SiC/SiO2 interfaces in oxidized porous SiC von Cantin, Jean-Louis, von Bardeleben, Jurgen, Ke, Y, Devaty, Rp, Choyke, Wj

Volltext

ZnO:Mn as a member of II-VI:Mn family von Chikoidze, E., Dumont, Y., von Bardeleben, H.J., Gleize, J., Jomard, F., Rzepka, E., Berrerar, G., Ferrand, D., Gorochov, O.

Volltext

Magnetic interactions in Zn1−xMnxO studied by electron paramagnetic resonance spectroscopy von Chikoidze, E., von Bardeleben, H. J., Dumont, Y., Galtier, P., Cantin, J. L.

Volltext

An electron paramagnetic resonance study of the Si[formula omitted]/Al2O3 interface defects von Cantin, J.L., von Bardeleben, H.J.

Volltext

Dependence of Magnetic Anisotropies and Critical Temperatures on the Hole Concentration in Ferromagnetic GaMnAs Thin Films von Khazen, Kh, von Bardeleben, H.J., Cantin, J.L., Thevenard, L., Largeau, L., Mauguin, O., Lemaitre, A.

Volltext

Expansion and Collapse of Domains With Reverse Magnetization in (Ga,Mn)As Epilayers With Perpendicular Magnetic Easy Axis von Dourlat, A., Gourdon, C., Jeudy, V., Testelin, C., Khazen, K., Cantin, J.L., von Bardeleben, H.J., Thevenard, L., Lemaitre, A.

Volltext

Correlation of optical absorption and density of paramagnetic centers in a-C:H films von Bouzerar, R., Zeinert, A., von Bardeleben, H.-J.

Volltext

Spins and microstructure of amorphous carbon von von Bardeleben, H.J, Cantin, J.L, Zellama, K, Zeinert, A

Volltext

A combined EPR and modulated photocurrent study of native defects in Bridgman grown vanadium doped cadmium telluride: the case of the tellurium antisite von Verstraeten, D, Longeaud, C, Mahmoud, A Ben, Bardeleben, H J von, Launay, J C, Viraphong, O, Lemaire, Ph C

Volltext

Spins and microstructure of hydrogenated amorphous carbon: A multiple frequency electron paramagnetic resonance study von von Bardeleben, H. J., Cantin, J. L., Zeinert, A., Racine, B., Zellama, K., Hai, P. N.

Volltext

Impurities and related microstructure in nanocrystalline silicon films grown by radiofrequency magnetron sputtering von Gonçalves, C., Zeinert, A., Charvet, S., Lejeune, M., Grosman, A., von Bardeleben, H.-J., Zellama, K.

Volltext

Interface Defects in n-Type 3C-SiC/SiO2: An EPR Study of Oxidized Porous Silicon Carbide Single Crystals von Cantin, J.L., Shishkin, Y., von Bardeleben, Hans Jürgen, Devaty, Robert P., Choyke, Wolfgang J., Ke, L.

Volltext

Electron irradiation induced defects in monocrystalline 4H–SiC and 6H–SiC: the influence of the electron energy and doping von von Bardeleben, H.J., Cantin, J.L.

Volltext

Electron paramagnetic resonance study of proton implantation induced defects in monocrystalline 4H– and 6H–SiC von von Bardeleben, H.J, Cantin, J.L

Volltext

Influence of annealing on the structural and magnetic properties of epitaxial Zn1-xMnxO films grown by MOCVD on sapphire von Chikoidze, E., von Bardeleben, H. J., Dumont, Y., Jomard, F., Gorochov, O.

Volltext