Mechanical Properties of Native and Cross-linked Type I Collagen Fibrils von Yang, Lanti, van der Werf, Kees O., Fitié, Carel F.C., Bennink, Martin L., Dijkstra, Pieter J., Feijen, Jan

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Mechanical properties of single electrospun collagen type I fibers von Yang, Lanti, Fitié, Carel F.C, van der Werf, Kees O, Bennink, Martin L, Dijkstra, Pieter J, Feijen, Jan

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Micromechanical Testing of Individual Collagen Fibrils von van der Rijt, Joost A. J., van der Werf, Kees O., Bennink, Martin L., Dijkstra, Pieter J., Feijen, Jan

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The native architecture of a photosynthetic membrane von Hunter, C. Neil, Bahatyrova, Svetlana, Frese, Raoul N, Siebert, C. Alistair, Olsen, John D, van der Werf, Kees O, van Grondelle, Rienk, Niederman, Robert A, Bullough, Per A, Otto, Cees

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Micromechanical bending of single collagen fibrils using atomic force microscopy von Yang, Lanti, van der Werf, Kees O., Koopman, Bart F.J.M., Subramaniam, Vinod, Bennink, Martin L., Dijkstra, Pieter J., Feijen, Jan

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Nanomechanical properties of α-synuclein amyloid fibrils: a comparative study by nanoindentation, harmonic force microscopy, and Peakforce QNM von Sweers, Kim, van der Werf, Kees, Bennink, Martin, Subramaniam, Vinod

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Atomic Force Microscopy under Controlled Conditions Reveals Structure of C-Terminal Region of α-Synuclein in Amyloid Fibrils von Sweers, Kim K. M, van der Werf, Kees O, Bennink, Martin L, Subramaniam, Vinod

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Flexibility and size heterogeneity of the LH1 light harvesting complex revealed by atomic force microscopy: functional significance for bacterial photosynthesis von Bahatyrova, Svetlana, Frese, Raoul N, van der Werf, Kees O, Otto, Cees, Hunter, C Neil, Olsen, John D

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Microscale mechanical properties of single elastic fibers: The role of fibrillin–microfibrils von Koenders, Mieke M.J.F, Yang, Lanti, Wismans, Ronnie G, van der Werf, Kees O, Reinhardt, Dieter P, Daamen, Willeke, Bennink, Martin L, Dijkstra, Pieter J, van Kuppevelt, Toin H, Feijen, Jan

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Spatially resolved frequency-dependent elasticity measured with pulsed force microscopy and nanoindentation von Sweers, Kim K. M, van der Werf, Kees O, Bennink, Martin L, Subramaniam, Vinod

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Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid von van Noort, S. John T, Willemsen, Oscar H, van der Werf, Kees O, de Grooth, Bart G, Greve, Jan

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Directed assembly of functional light harvesting antenna complexes onto chemically patterned surfaces von Escalante, Maryana, Maury, Pascale, Bruinink, Christiaan M, van der Werf, Kees, Olsen, John D, Timney, John A, Huskens, Jurriaan, Neil Hunter, C, Subramaniam, Vinod, Otto, Cees

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Simultaneous Height and Adhesion Imaging of Antibody-Antigen Interactions by Atomic Force Microscopy von Willemsen, Oscar H., Snel, Margot M.E., van der Werf, Kees O., de Grooth, Bart G., Greve, Jan, Hinterdorfer, Peter, Gruber, Hermann J., Schindler, Hansgeorg, van Kooyk, Yvette, Figdor, Carl G.

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High Speed Atomic Force Microscopy of Biomolecules by Image Tracking von van Noort, S. John T., van der Werf, Kees O., de Grooth, Bart G., Greve, Jan

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Neurotoxicity of Alzheimer's disease Aβ peptides is induced by small changes in the Aβ42 to Aβ40 ratio von Kuperstein, Inna, Broersen, Kerensa, Benilova, Iryna, Rozenski, Jef, Jonckheere, Wim, Debulpaep, Maja, Vandersteen, Annelies, Segers-Nolten, Ine, Van Der Werf, Kees, Subramaniam, Vinod, Braeken, Dries, Callewaert, Geert, Bartic, Carmen, D'Hooge, Rudi, Martins, Ivo Cristiano, Rousseau, Frederic, Schymkowitz, Joost, De Strooper, Bart

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Fabrication and Visualization of Metal-Ion Patterns on Glass by Dip-Pen Nanolithography von Basabe-Desmonts, Lourdes, Wu, Chien-Ching, van der Werf, Kees O., Peter, Maria, Bennink, Martin, Otto, Cees, Velders, Aldrik H., Reinhoudt, David N., Subramaniam, Vinod, Crego-Calama, Mercedes

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Tapping mode atomic force microscopy in liquid von Putman, Constant A. J., Van der Werf, Kees O., De Grooth, Bart G., Van Hulst, Niek F., Greve, Jan

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Unexpected Binding Motifs for Subnucleosomal Particles Revealed by Atomic Force Microscopy von Nikova, Dessy N., Pope, Lisa H., Bennink, Martin L., van Leijenhorst-Groener, Kirsten A., van der Werf, Kees, Greve, Jan

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Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation von Kassies, Roel, van der Werf, Kees O., Bennink, Martin L., Otto, Cees

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Compact stand‐alone atomic force microscope von van der Werf, Kees. O., Putman, Constant A. J., de Grooth, Bart G., Segerink, Frans B., Schipper, Eric H., van Hulst, Niek F., Greve, Jan

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