Systematic x-ray photoelectron spectroscopic study of La1−xSrx-based perovskite-type oxides von van der Heide, P. A. W.

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4d core hole formation in silver and its role in Ag − secondary ion formation/survival von van der Heide, P.A.W.

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Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1 keV Cs + impact von van der Heide, P.A.W.

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SIMS imaging of insulator surfaces von van der Heide, P. A. W., McIntyre, N. S.

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Topographic Correction of 3D SIMS Images von Wagter, M. L., Clarke, A. H., Taylor, K. F., van der Heide, P. A. W., McIntyre, N. S.

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Incorporation of Titanium into Mesoporous Silica Molecular Sieve SBA-15 von Luan, Zhaohua, Maes, Estelle M, van der Heide, Paul A. W, Zhao, Dongyuan, Czernuszewicz, Roman S, Kevan, Larry

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Multiplet splitting patterns exhibited by the first row transition metal oxides in X-ray photoelectron spectroscopy von van der Heide, P.A.W.

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The infinite velocity method: A new method for SIMS quantification von Van Der Heide, P. A. W., Zhang, Min, Mount, G. R., McIntyre, N. S.

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Characterization of porous titania glass: Raman, x-ray diffraction and x-ray photoelectron spectroscopic studies von Chee, Yee Hong, Cooney, R. P., Howe, R. F., van der Heide, P. A. W.

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Oxidation Kinetics of Mg-, Si-, and Fe-Implanted Aluminum by Using X-ray Photoelectron Spectroscopy von Do, T, McIntyre, N. S, van der Heide, P. A. W, Akano, U. G

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X-ray photoelectron spectroscopic and ion scattering study of the SrTiO3(001) surface von VAN DER HEIDE, P. A. W, JIANG, Q. D, KIM, Y. S, RABALAIS, J. W

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Charge stabilization and ion trapping under specimen isolation conditions during Sims analysis von van der Heide, P. A. W., Metson, J. B., Lau, W. M.

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Single-Molecule I2@US-Tube Nanocapsules: A New X-ray Contrast-Agent Design von Ashcroft, J. M., Hartman, K. B., Kissell, K. R., Mackeyev, Y., Pheasant, S., Young, S., Van der Heide, P. A. W., Mikos, A. G., Wilson, L. J.

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A systematic study of the characteristic velocities of the negative secondary ion emissions of H, O and matrix species from Sc, Ti, V, Co, Ni and Cu substrates von van der Heide, P.A.W.

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Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1keV Cs+ impact von van der Heide, P.A.W.

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Secondary ion formation/survival during the initial stages of sputtering Si and SiO2 with Cs von VAN DER HEIDE, P. A. W

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Surface core level shifts in photo-electron spectra from the Ca, Sr and Ba titanates von van der Heide, P.A.W.

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Quantitative SIMS analysis of trace Au in pyrite using the infinite velocity (IV) method von Pratt, A.R., Huctwith, C.M., van der Heide, P.A.W., McIntyre, N.S.

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Secondary ion emission and work function measurements over the transient region from n and p type Si under Cs + irradiation von van der Heide, P.A.W.

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Work function, valence band and secondary ion intensity variations noted during the initial stages of SIMS depth profiling of Si and SiO2 by Cs von VAN DER HEIDE, P. A. W, AZZARELLO, F. V

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