Experiments with atomic hydrogen in a magnetic trapping field von VAN ROIJEN, R, BERKHOUT, J. J, JAAKKOLA, S, WALRAVEN, J. T. M

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Control of etch and deposition for embedded SiGe von Van Roijen, R, Kempisty, J, Sinn, C, Afoh, W, Tabakman, K, Logan, R

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Theory for passive mode-locking in semiconductor laser structures including the effects of self-phase modulation, dispersion, and pulse collisions von Koumans, R.G.M.P., Van Roijen, R.

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Vanishing sticking probabilities and enhanced capillary flow of spin-polarized hydrogen von BERKHOUT, J. J, WOLTERS, E. J, VAN ROIJEN, R, WALRAVEN, J. T. M

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Compact InP-based ring lasers employing multimode interference couplers and combiners von Roijen, R. van, Pennings, E. C. M., van Stalen, M. J. N., van Dongen, T., Verbeek, B. H., van der Heijden, J. M. M.

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Over 15 dB gain from a monolithically integrated optical switch with an amplifier von van Roijen, R., van der Heijden, J.M.M., Tiemeijer, L.F., Thijs, P.J.A., van Dongen, T., Binsma, J.J.M., Verbeek, B.H.

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Reducing Environmentally Induced Defects While Maintaining Productivity von van Roijen, R., Conti, S. G., Keyser, R., Arndt, R., Burda, R., Ayala, J., Henry, R. O., Levy, J., Maxson, J., Meyette, E., Steer, W., Tabakman, K., Chienfan Yu

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Reflection properties of multimode interference devices von Pennings, E.C.M., van Roijen, R., van Stralen, M.J.N., de Waard, P.J., Koumans, R.G.M.P., Verbeck, B.H.

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Relation between robustness against ESD and against flash events in deflection amplifiers von van Roijen, R., Ludikhuize, A.W., Voets, J., van Oosten, P.

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Systematic edge inspection for defect reduction von Joshi, P., Van Roijen, R., Coffin, J., Conti, S., Flaitz, P., Eastman, J.

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Defect reduction by nitrogen purge of wafer carriers von van Roijen, R., Joshi, P., Bailey, D., Conti, S., Brennan, W., Findeis, P.

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Improved device ruggedness by floating buffer ring von Ludikhuize, A.W., Heringa, A., Van Roijen, R., Van Zwol, J.

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Application and control of Laser Anneal at the 65 and 45 nm node von Van Roijen, R., Gluchenkov, O., Willis, J., Hurley, M.

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Surface analysis of reactive ion-etched InP von VAN ROIJEN, R, KEMP, M. B. M, BULLE-LIEUWMA, C. W. T, VAN LZENDOORN, L. J, THIJSSEN, T. L. G

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A comprehensive approach to process control von van Roijen, R., Sinn, C., Afoh, W., Hwang, E., Scarano, J., Rangarajan, S., Brown, J. J., Brennan, W., Conti, S., Keyser, R.

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A novel in-line monitor for optimizing power vs. performance in CMOS logic von Van Roijen, R., Loiseau, A., Rawlins, B., Logan, R.

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Reducing environmentally induced defects while maintaining productivity von van Roijen, R., Conti, S., Keyser, R., Arndt, R., Burda, R., Ayala, J., Henry, R., Levy, J., Maxson, J., Meyette, E., Steer, W., Tabakman, K., Yu, C.

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Reducing Time-to-Respond in a Modern Manufacturing Environment von Van Roijen, R., Collins, C., Ayala, J., Barker, K., Boiselle, H., Catlett, S., Dezfulian, K., Logan, R., Maxson, J., Ramachandran, R., Rawlins, B., Ruegsegger, S., Rust, T., Shepard, J., Singh, R.

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Correction to "Theory for Passive Mode-Locking in Semiconductor Laser Structures Including the Effec von Koumans, R.G.M.P., Salvatore, R.A., Eliyahu, D., van Roijen, R.

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Ultracompact multimode interference waveguide devices von Pennings, E.C.M., van Roijen, R., Verbeek, B.H., Deri, R.J., Soldano, L.B.

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