Phospholipid fatty acid profiling of microbial communities–a review of interpretations and recent applications von Willers, C, Jansen van Rensburg, P.J, Claassens, S

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Analysis of temperature-dependant current–voltage characteristics and extraction of series resistance in Pd/ZnO Schottky barrier diodes von Mayimele, M A, van Rensburg, J P. Janse, Auret, F D, Diale, M

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Microbial signature lipid biomarker analysis – an approach that is still preferred, even amid various method modifications von Willers, C, Jansen van Rensburg, P.J, Claassens, S

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Microbial metabolomics: essential definitions and the importance of cultivation conditions for utilizing Bacillus species as bionematicides von Horak, I., Engelbrecht, G., Rensburg, P.J. Jansen, Claassens, S.

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Electrical characterization of defects introduced in n-Ge during electron beam deposition or exposure von Coelho, S. M. M., Auret, F. D., Janse van Rensburg, P. J., Nel, J. M.

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Analysis of temperature dependent I – V measurements on Pd/ZnO Schottky barrier diodes and the determination of the Richardson constant von Mtangi, W., Auret, F.D., Nyamhere, C., Janse van Rensburg, P.J., Chawanda, M. Diale, A.

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Soil Microbial Community Function and Structure in a Post-mining Chronosequence von Claassens, S, Jansen van Rensburg, P. J, Maboeta, M. S, van Rensburg, L

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Electrical characterisation of deep level defects created by bombarding the n-type 4H-SiC with 1.8 MeV protons von Omotoso, E., Paradzah, A.T., Janse van Rensburg, P.J., Legodi, M.J., Auret, F.D., Igumbor, E., Danga, H.T., Diale, M., Meyer, W.E.

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Effects of hydrogen, oxygen, and argon annealing on the electrical properties of ZnO and ZnO devices studied by current-voltage, deep level transient spectroscopy, and Laplace DLTS von Mtangi, W., Auret, F. D., Meyer, W. E., Legodi, M. J., Janse van Rensburg, P. J., Coelho, S. M. M., Diale, M., Nel, J. M.

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Inductively coupled plasma induced deep levels in epitaxial n-GaAs von Auret, F.D., Janse van Rensburg, P.J., Meyer, W.E., Coelho, S.M.M., Kolkovsky, Vl, Botha, J.R., Nyamhere, C., Venter, A.

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Electrical characterization of He+ irradiated n-ZnO von Hayes, M., Auret, F. D., Janse van Rensburg, P. J., Nel, J. M., Wesch, W., Wendler, E.

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Seasonal exposures to triazine and other pesticides in surface waters in the western Highveld corn-production region in South Africa von Du Preez, L.H., Jansen van Rensburg, P.J., Jooste, A.M., Carr, J.A., Giesy, J.P., Gross, T.S., Kendall, R.J., Smith, E.E., Van Der Kraak, G., Solomon, K.R.

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Unexpected properties of the inductively coupled plasma induced defect in germanium von Coelho, S.M.M., Auret, F.D., Janse van Rensburg, P.J., Nel, J.M.

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Effects of high temperature annealing on single crystal ZnO and ZnO devices von Mtangi, W., Auret, F. D., Diale, M., Meyer, W. E., Chawanda, A., de Meyer, H., Janse van Rensburg, P. J., Nel, J. M.

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Dependence of Trap Concentrations in ZnO Thin Films on Annealing Conditions von Wenckstern, H. von, Biehne, G., Lorenz, M., Grundmann, M., Auret, F. D., Meyer, W. E., Rensburg, P. J. Janse van, Hayes, M., Nel, J. M.

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The influence of high energy electron irradiation on the Schottky barrier height and the Richardson constant of Ni/4H-SiC Schottky diodes von Omotoso, E., Meyer, W.E., Auret, F.D., Paradzah, A.T., Diale, M., Coelho, S.M.M., Janse van Rensburg, P.J.

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Electronic properties and transformation kinetics of two prominent metastable defects introduced in GaAs during sputter deposition of Au Schottky contacts von Taghizadeh, F., Janse van Rensburg, P.J., Ostvar, K., Meyer, W.E., Auret, F.D.

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Effects of 5.4 MeV alpha-particle irradiation on the electrical properties of nickel Schottky diodes on 4H–SiC von Omotoso, E., Meyer, W.E., Auret, F.D., Paradzah, A.T., Diale, M., Coelho, S.M.M., Janse van Rensburg, P.J., Ngoepe, P.N.M.

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A study of the T2 defect and the emission properties of the E3 deep level in annealed melt grown ZnO single crystals von Mtangi, W., Schmidt, M., Auret, F. D., Meyer, W. E., Janse van Rensburg, P. J., Diale, M., Nel, J. M., Das, A. G. M., Ling, F. C. C., Chawanda, A.

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The dependence of barrier height on temperature for Pd Schottky contacts on ZnO von Mtangi, W., Auret, F.D., Nyamhere, C., Janse van Rensburg, P.J., Chawanda, A., Diale, M., Nel, J.M., Meyer, W.E.

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