The relationship between microsystem technology and metrology von Wolffenbuttel, R.F., van Mullem, C.J.

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Bulk micromachined electrostatic RMS-to-DC converter von de Graaf, G., Bartek, M., Xiao, Z., van Mullem, C.J., Wolffenbuttel, R.F.

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Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL, PTB, and NIST von Filipski, P.S., van Mullem, C.J., Janik, D., Klonz, M., Kinard, J.R., Lipe, T.E., Waltrip, B.C.

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Guest editorial von Wolffenbuttel, R.F., Van Mullem, C.J.

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Guest editorial von Wolffenbuttel, R.F., Van Mullem, C.J.

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Guest editorial von Wolffenbuttel, R.F, Van Mullem, C.J

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CCE 92-05 intercomparison of ac-dc voltage transfer standards at high frequencies (1-50 MHz) von van Mullem, C.J.

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Improvements in AC-DC voltage transfer at CENAM von Campos, S., Klonz, M., Van Mullem, C.J.

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Electrical cross-talk in two-port resonators — the resonant silicon beam force sensor von van Mullem, C.J., Tilmans, H.A.C., Mouthaan, A.J., Fluitman, J.H.J.

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Improvements of the NMi VSL HF AC-DC transfer facilities von van Mullem, C.J., Dessens, J.T.

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Microtechnology and microsystems in measurement applications von Wolffenbuffel, R.F., van Mullem, C.J.

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Piezoelectrically driven silicon beam force sensor von Van Mullem, C.J., Blom, F.R., Fluitman, J.H.J., Elwenspoek, M.

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Comparison of high frequency AC-DC voltage transfer standards at NRC, VSL, PTB and NIST von Filipski, P.S., Van Mullem, C.J., Janik, D., Klonz, M., Kinard, J.R., Lipe, T., Waltrip, B.

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Key Comparison CCEM-K6.c of AC-DC Voltage Transfer Standards at Selected Frequencies between 1 MHz and 100 MHz von Dierikx, E.F., van Mullem, C.J., de Vreede, J.P.M.

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CCE intercomparison of AC-DC voltage transfer standards at high frequencies (1-50 MHz) von van Mullem, C.J.

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Uncertainty analysis of a DVM-based quantum Hall measurement set-up von Rietveld, C., Van Mullem, C.J.

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Large deflection performance of surface micromachined corrugated diaphragms von van Mullem, C.J., Gabriel, K.J., Fujita, H.

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