Recurrent inference machines as inverse problem solvers for MR relaxometry von Sabidussi, E.R., Klein, S., Caan, M.W.A., Bazrafkan, S., den Dekker, A.J., Sijbers, J., Niessen, W.J., Poot, D.H.J.

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Maximum likelihood estimation of signal amplitude and noise variance from MR data von Sijbers, J., den Dekker, A.J.

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Estimation of unknown structure parameters from high-resolution (S)TEM images: What are the limits? von den Dekker, A.J., Gonnissen, J., De Backer, A., Sijbers, J., Van Aert, S.

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Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images von Gonnissen, J., De Backer, A., den Dekker, A. J., Martinez, G. T., Rosenauer, A., Sijbers, J., Van Aert, S.

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Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design von Gonnissen, J., De Backer, A., den Dekker, A.J., Sijbers, J., Van Aert, S.

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Estimation of the Noise in Magnitude MR Images von Sijbers, J., den Dekker, A.J., Van Audekerke, J., Verhoye, M., Van Dyck, D.

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The maximum a posteriori probability rule for atom column detection from HAADF STEM images von Fatermans, J., Van Aert, S., den Dekker, A.J.

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Atom column detection from simultaneously acquired ABF and ADF STEM images von Fatermans, J., den Dekker, A.J., Müller-Caspary, K., Gauquelin, N., Verbeeck, J., Van Aert, S.

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Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework von den Dekker, A.J., Van Aert, S., van den Bos, A., Van Dyck, D.

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Data distributions in magnetic resonance images: A review von den Dekker, A.J, Sijbers, J

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Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images von Fatermans, J, den Dekker, A J, Müller-Caspary, K, Lobato, I, O'Leary, C M, Nellist, P D, Van Aert, S

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Optimal experimental design of STEM measurement of atom column positions von Van Aert, S., den Dekker, A.J., Van Dyck, D., van den Bos, A.

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Adaptive anisotropic noise filtering for magnitude MR data von Sijbers, J., den Dekker, A.J., Van der Linden, A., Verhoye, M., Van Dyck, D.

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Likelihood-Based Hypothesis Tests for Brain Activation Detection From MRI Data Disturbed by Colored Noise: A Simulation Study von den Dekker, A.J., Poot, D.H.J., Bos, R., Sijbers, J.

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Does a monochromator improve the precision in quantitative HRTEM? von den Dekker, A.J., Van Aert, S., Van Dyck, D., van den Bos, A., Geuens, P.

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Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example von Van Aert, S., den Dekker, A.J., van den Bos, A., Van Dyck, D., Chen, J.H.

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Atom-counting in High Resolution Electron Microscopy:TEM or STEM – That's the question von Gonnissen, J., De Backer, A., den Dekker, A.J., Sijbers, J., Van Aert, S.

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Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? von Van Dyck, D., Van Aert, S., den Dekker, A.J., van den Bos, A.

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Generalized likelihood ratio tests for complex fMRI data: a Simulation study von Sijbers, J., den Dekker, A.J.

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High-resolution electron microscopy and electron tomography: resolution versus precision von Van Aert, S., den Dekker, A.J., Van Dyck, D., van den Bos, A.

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