Scrutinizing the Intermittency of Renewable Energy in a Long-Term Planning Model via Combining Direct Integration and Soft-Linking Methods for Colombia’s Power System von Younis, Ahmed, Benders, René, Ramírez, Jezabel, de Wolf, Merlijn, Faaij, André

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Scrutinizing the Intermittency of Renewable Energy in a Long-Term Planning Model via Combining Direct Integration and Soft-Linking Methods for Colombia’s Power System von Younis, Ahmed, Benders, René, Ramírez, Jezabel, de Wolf, Merlijn, Faaij, André

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A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches von Spengen, W Merlijn van, Puers, Robert, Mertens, Robert, Wolf, Ingrid De

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A physical model to predict stiction in MEMS von Spengen, W Merlijn van, Puers, Robert, Wolf, Ingrid De

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A low frequency electrical test set-up for the reliability assessment of capacitive RF MEMS switches von Spengen, W Merlijn van, Puers, Robert, Mertens, Robert, Wolf, Ingrid De

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Characterization and failure analysis of MEMS: High resolution optical investigation of small out-of-plane movements and fast vibrations von VAN SPENGEN, W. Merlijn, PUERS, R, MERTENS, R, DE WOLF, Ingrid

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The investigation of microsystems using Raman spectroscopy von De Wolf, Ingrid, Jian, Chen, van Spengen, W.Merlijn

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A physical model to predict stiction ir MEMS von MERLIJN VAN SPENGEN, W, PUERS, Robert, DE WOLF, Ingrid

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The influence of the package environment on the functioning and reliability of RF-MEMS switches von van Spengen, W.M., Czarnecki, P., Puers, R., van Beek, J.T.M., De Wolf, I.

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The investigation of microsystems using Raman spectroscopy: Microsystems Metrology von DE WOLF, Ingrid, CHEN JIAN, VAN SPENGEN, W. Merlijn

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Experimental characterization of stiction due to charging in RF MEMS von van Spengen, Willem Merlijn, Puers, Robert, Mertens, Robert, De Wolf, Ingrid

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Methodology to assess the reliability behavior of RF-MEMS von Dubuc, D., Van Spengen, M., Melle, S., De Wolf, I., Mertens, R., Pons, P., Grenier, K., Plana, R.

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The prediction of stiction failures in MEMS: Interface reliability von VAN SPENGEN, W. Merlijn, PUERS, Robert, DE WOLF, Ingrid

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