Observation of the subgap optical absorption in polymer-fullerene blend solar cells von Goris, L., Poruba, A., Hod'ákova, L., Vaněček, M., Haenen, K., Nesládek, M., Wagner, P., Vanderzande, D., De Schepper, L., Manca, J. V.

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Absorption phenomena in organic thin films for solar cell applications investigated by photothermal deflection spectroscopy von Goris, L., Haenen, K., Nesládek, M., Wagner, P., Vanderzande, D., De Schepper, L., D’haen, J., Lutsen, L., Manca, J. V.

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The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensors von Esch, H, Huyberechts, G, Mertens, R, Maes, G, Manca, J, De Ceuninck, W, De Schepper, L

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The phosphorous level fine structure in homoepitaxial and polycrystalline n-type CVD diamond von Haenen, K., Nesládek, M., De Schepper, L., Kravets, R., Vaněček, M., Koizumi, S.

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Understanding oxide degradation mechanisms in ultra-thin SiO2 through high-speed, high-resolution in-situ measurements von Aresu, S., De Ceuninck, W., Degraeve, R., Kaczer, B., Knuyt, G., Schepper, L. De

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Spatial distribution of interface traps in DeMOS transistors von Moens, P., Vlachakis, B., Bauwens, F., De Schepper, L.

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Nanostructured organic pn junctions towards 3D photovoltaics von MARTENS, T, MUNTERS, T, DE SCHEPPER, L, MANCA, J. V, GORIS, L, D'HAEN, J, SCHOUTEDEN, K, D'OLIESLAEGER, M, LUTSEN, L, VANDERZANDE, D, GEENS, W, POORTMANS, J

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Poly(5,6-dithiooctylisothianaphtene), a new low band gap polymer: spectroscopy and solar cell construction von Goris, L., Loi, M.A., Cravino, A., Neugebauer, H., Sariciftci, N.S., Polec, I., Lutsen, L., Andries, E., Manca, J., De Schepper, L., Vanderzande, D.

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Reversible Switching of the Surface Conductance of Hydrogenated CVD Diamond Films von Cannaerts, M., Nesladek, M., Haenen, K., Stals, L.M., De Schepper, L., Van Haesendonck, C.

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Investigation of the formation process of MCs +-molecular ions during sputtering von Vlekken, Johan, D’Olieslaeger, Marc, Knuyt, Gilbert, Vandervorst, Wilfried, De Schepper, Luc

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A new method for the analysis of high-resolution SILC data von Aresu, S., De Ceuninck, W., Knuyt, G., Mertens, J., Manca, J., De Schepper, L., Degraeve, R., Kaczer, B., D’Olieslaeger, M., D’Haen, J.

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High-resolution in-situ study of gold electromigration: Test time reduction von Croes, K, Dreesen, R, Manca, J, De Ceuninck, W, De Schepper, L, Tielemans, L, Van Der Wel, P

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High-resolution SILC measurements of thin SiO2 at ultra low voltages von Aresu, S., De Ceuninck, W., Dreesen, R., Croes, K., Andries, E., Manca, J., De Schepper, L., Degraeve, R., Kaczer, B., D’Olieslaeger, M., D’Haen, J.

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A method to minimize test time for accelerated ageing of pHEMT's by analysis of the electronic fingerprint of the initial stage of degradation von Petersen, R., De Ceuninck, W., De Schepper, L., Muraro, J.-L.

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High electrical resistivity of CVD-diamond von Manca, J.V, Nesladek, M, Neelen, M, Quaeyhaegens, C, De Schepper, L, De Ceuninck, W

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Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique von Dreesen, R., Croes, K., Manca, J., De Ceuninck, W., De Schepper, L., Pergoot, A., Groeseneken, G.

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Bimodal failure behaviour of metal film resistors von Croes, K., de Ceuninck, W., de Schepper, L., Tielemans, L.

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Floating gate AC nulling (FGAN) technique for characterisation of matching properties of MOS capacitors von Zhenqiu Ning, De Schepper, L., Gillon, R., Tack, M.

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The time of “guessing” your failure time distribution is over von Croes, K., Manca, J.V., De Ceuninck, W., De Schepper, L., Molenberghs, G.

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In-situ sem observation of electromigration in thin metal films at accelerated stress conditions von d'Haen, J., Van Olmen, J., Beelen, Z., Manca, J.V., Martens, T., De Ceuninck, W., d'Olieslaeger, M., De Schepper, L., Cannaerts, M., Maex, K.

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