Monitoring and Forecasting COVID-19: Heuristic Regression, Susceptible-Infected-Removed Model and, Spatial Stochastic von de Andres, P.L., de Andres-Bragado, L., Hoessly, L.

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Valence band electronic structure characterization of the rutile TiO2 (110)-(1×2) reconstructed surface von Sánchez-Sánchez, C., Garnier, M.G., Aebi, P., Blanco-Rey, M., de Andres, P.L., Martín-Gago, J.A., López, M.F.

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Theory of ballistic electron emission microscopy von de Andres, P.L., Garcia-Vidal, F.J., Reuter, K., Flores, F.

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Rotation assisted diffusion of water trimers on Pd{111} von Ranea, Víctor A., de Andres, P.L.

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Surface atomic structure determination of three-dimensional yttrium silicide epitaxially grown on Si(111) von ROGERO, C, DE ANDRES, P. L, MARTIN-GAGO, J. A

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Adsorption and reaction of CO2 on Ni{110}: X-ray photoemission, near-edge X-ray absorption fine-structure and diffuse leed studies von Illing, G., Heskett, D., Plummer, E.W., Freund, H.-J., Somers, J., Lindner, Th, Bradshaw, A.M., Buskotte, U., Neumann, M., Starke, U., Heinz, K., De Andres, P.L., Saldin, D., Pendry, J.B.

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Anisotropic and anharmonic effects through the t-matrix for Low-Energy Electron Diffraction (TMAT V1.1) von De Andres, P.L.

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Anisotropic and anharmonic effects through the t-matrix for Low-Energy Electron Diffraction (TMAT V1.1) von De Andres, P.L.

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Structure of Rutile TiO{sub 2} (110)-(1x2): Formation of Ti{sub 2}O{sub 3} Quasi-1D Metallic Chains von Blanco-Rey, M., Abad, J., Rogero, C., Mendez, J., Lopez, M.F., Martin-Gago, J.A., Andres, P.L. de

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Holographic Leed von SALDIN, D. K, ANDRES, P. L

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Anisotropic and anharmonic effects through the t-matrix for Low-Energy Electron Diffraction (TMAT V1.1) von de Andres, P.L., King, D.A.

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A comparison between BEEM currents on Au/Si(1 1 1) and Au/Si(1 0 0): inelastic and geometrical effects von de Pablos, P.F, Garcı́a-Vidal, F.J, Flores, F, de Andres, P.L

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Electronic surface structure of CoSi 2(111)/Si(111): implications for ballistic electron-emission microscopy currents von Reuter, K, de Andres, P.L, Garcı́a-Vidal, F.J, Flores, F, Heinz, K

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Green's function calculation of Ballistic Electron Emission Microscopy currents (BEEM v2.1) von Reuter, K.

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Green's function calculation of Ballistic Electron Emission Microscopy currents (BEEM v2.1) von Reuter, K.

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Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals von de Pablos, P.F., de Andres, P.L., Ladstaedter, F, Hohenester, U, Puschnig, P, Ambrosch-Draxl, C, Garcia-Vidal, F J, Flores, F

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Green's function calculation of Ballistic Electron Emission Microscopy currents (BEEM v2.1) von Reuter, K., de Andres, P.L., Garcia-Vidal, F.J., Sestovic, D., Flores, F., Heinz, K.

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Electronic surface structure of CoSi2(111)/Si(111): implications for ballistic electron-emission microscopy currents von REUTER, K, DE ANDRES, P. L, GARCIA-VIDAL, F. J, FLORES, F, HEINZ, K

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A theoretical analysis of ballistic electron emission microscopy: k-space distributions and spectroscopy von de Andres, P.L., Reuter, K., Garcia-Vidal, F.J., Sestovic, D., Flores, F.

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Detecting stacking faults during epitaxial growth by low energy electron diffraction von Ascolani, H., Cerda, J.R., de Andres, P.L., de Miguel, J.J., Miranda, R., Heinz, K.

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