Test structures for referencing electrical linewidth measurements to silicon lattice parameters using HRTEM von Allen, R.A., am Ende, B.A., Cresswell, M.W., Murabito, C.E., Headley, T.J., Guthrie, W.F., Linholm, L.W., Ellenwood, C.H., Bogardus, E.H.

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Accelerating Scientific Discovery Through Computation and Visualization von Sims, J S, Hagedorn, J G, Ketcham, P M, Satterfield, S G, Griffin, T J, George, W L, Fowler, H A, Am Ende, B A, Hung, H K, Bohn, R B, Koontz, J E, Martys, N S, Bouldin, C E, Warren, J A, Feder, D L, Clark, C W, Filla, B J, Devaney, J E

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Lithoherms on the Florida–Hatteras slope von Paull, C.K, Neumann, A.C, am Ende, B.A, Ussler III, W, Rodriguez, N.M

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3D mapping of underwater caves von am Ende, B.A.

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