Parallel Sparse Matrix Solution for Circuit Simulation on FPGAs von Nechma, Tarek, Zwolinski, Mark

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IEEE Access Special Section Editorial: Security and Reliability Aware System Design for Mobile Computing Devices von Sengupta, Anirban, Mohanty, Saraju P., Lombardi, Fabrizio, Zwolinski, Mark

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Lifetime Reliability-Aware Digital Synthesis von Duan, Shengyu, Zwolinski, Mark, Halak, Basel

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Evaluation of Dynamic Voltage and Frequency Scaling as a Differential Power Analysis Countermeasure von Baddam, K., Zwolinski, M.

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Learning-based BTI stress estimation and mitigation in multi-core processor systems von Abbas, Haider Muhi, Halak, Basel, Zwolinski, Mark

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A reliable PUF in a dual function SRAM von Mispan, Mohd Syafiq, Duan, Shengyu, Halak, Basel, Zwolinski, Mark

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BTI mitigation by anti-ageing software patterns von Abbas, Haider Muhi, Halak, Basel, Zwolinski, Mark

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Monte Carlo Static Timing Analysis with statistical sampling von Merrett, Michael, Zwolinski, Mark

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Multi-Path Aging Sensor for Cost-Efficient Delay Fault Prediction von Sai, Gaole, Halak, Basel, Zwolinski, Mark

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A Low-Cost, Radiation-Hardened Method for Pipeline Protection in Microprocessors von Yang Lin, Zwolinski, Mark, Halak, Basel

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Parallel sparse matrix solver for direct circuit simulations on FPGAs von Nechma, Tarek, Zwolinski, Mark, Reeve, Jeff

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VLSI Implementation of a Fully-Pipelined K-Best MIMO Detector with Successive Interference Cancellation von Bello, Ibrahim A., Halak, Basel, El-Hajjar, Mohammed, Zwolinski, Mark

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Resilient routing implementation in 2D mesh NoC von Bishnoi, Rimpy, Laxmi, Vijay, Gaur, Manoj Singh, Zwolinski, Mark

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Evaluating system security using Transaction Level Modelling von Bushager, Aisha, Zwolinski, Mark

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Using Formal Verification to Evaluate Single Event Upsets in a RISC-V Core von Xue, Bing, Zwolinski, Mark

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Guest Editorial von Zwolinski, Mark, Gaur, Manoj Singh, Laxmi, Vijay, Mehta, Usha

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Guest Editorial von Zwolinski, Mark, Gaur, Manoj Singh, Laxmi, Vijay, Mehta, Usha

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A Survey of VLSI Implementations of Tree Search Algorithms for MIMO Detection von Bello, Ibrahim A., Halak, Basel, El-Hajjar, Mohammed, Zwolinski, Mark

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Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs von Mohammadat, Mohamed Tagelsir, Ali, Noohul Basheer Zain, Hussin, Fawnizu Azmadi, Zwolinski, Mark

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Resistive Open Faults Detectability Analysis and Implicationsfor Testing Low Power Nanometric ICs von Mohammadat, Tage, Ali, Noohul Basheer Zain, Hussin, Fawnizu Azmadi, Zwolinski, Mark

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