Simultaneous optical flow and source estimation: Space–time discretization and preconditioning von Andreev, R., Scherzer, O., Zulehner, W.

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A robust finite element solver for a multiharmonic parabolic optimal control problem von Kollmann, M., Kolmbauer, M., Langer, U., Wolfmayr, M., Zulehner, W.

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Inexact Data‐Sparse Boundary Element Tearing and Interconnecting Methods von Langer, U., Of, G., Steinbach, O., Zulehner, W.

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Analysis of iterative methods for saddle point problems: a unified approach von Zulehner, Walter

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Czochralski growth of silicon von Zulehner, W.

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The Growth of Highly Pure Silicon Crystals von Zulehner, W

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Impact of vacancies and self-interstitials on the formation of substitutional transition metal defects in float-zone silicon crystals von Lemke, H, Zulehner, W

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Historical overview of silicon crystal pulling development von Zulehner, Werner

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A class of smoothers for saddle point problems von ZULEHNER, W

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Numerical simulation of extraction columns using a drop population model von Kronberger, T., Ortner, A., Zulehner, W., Bart, H.J.

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Dynamic simulation of crankshaft multibody systems von Drab, C. B., Engl, H. W., Haslinger, J. R., Offner, G., Pfau, R. U., Zulehner, W.

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Investigations on the correlation between growth rate and gate oxide integrity of Czochralski-grown silicon von Zemke, D., Gerlach, P., Zulehner, W., Jacobs, K.

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On Schwarz-type smoothers for Saddle point problems von SCHÖBERL, Joachim, ZULEHNER, Walter

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Nitrogen-oxygen complexes in Czochralski-silicon von Wagner, P., Oeder, R., Zulehner, W.

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The silicon-28 path to the Avogadro constant-first experiments and outlook von Becker, P., Bettin, H., De Bievre, P., Holm, C., Kutgens, U., Spieweck, F., Stumpel, J., Valkiers, S., Zulehner, W.

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Effect of Thermal Diffuse Scattering in Triple-Crystal Diffractometry with High-Energy Synchrotron Radiation von Schmidt, T., Woo, D., Keitel, S., Schneider, J. R., Lambert, U., Zulehner, W.

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INEXACT DATA-SPARSE BOUNDARY ELEMENT TEARING AND INTERCONNECTING METHODS von LANGER, U, OF, G, STEINBACH, O, ZULEHNER, W

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EXCITATION-POWER DEPENDENCE OF THE NEAR-BAND-EDGE PHOTOLUMINESCENCE OF SEMICONDUCTORS von SCHMIDT, T, LISCHKA, K, ZULEHNER, W

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Quantitative phonon spectroscopy of interstitial oxygen in silicon von Wurster, C., Dittrich, E., Scheitler, W., Laβmann, K., Eisenmenger, W., Zulehner, W.

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Distribution of SiO2 precipitates in large, oxygen rich Czochralski-grown silicon single crystals after annealing at 750 °C von Bouchard, R., Schneider, J. R., Gupta, S., Messoloras, S., Stewart, R. J., Nagasawa, H., Zulehner, W.

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