Effects of temperature and doping concentration on the piezoresistive property of vanadium dioxide thin film von Inomata, Naoki, Usuda, Takuto, Yamamoto, Yuji, H. Zoellner, Marvin, Costina, Ioan, Ono, Takahito

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Role of critical thickness in SiGe/Si/SiGe heterostructure design for qubits von Liu, Yujia, Gradwohl, Kevin-P., Lu, Chen-Hsun, Remmele, Thilo, Yamamoto, Yuji, Zoellner, Marvin H., Schroeder, Thomas, Boeck, Torsten, Amari, Houari, Richter, Carsten, Albrecht, Martin

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Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X‑ray Diffraction Microscopy von Zoellner, Marvin H, Richard, Marie-Ingrid, Chahine, Gilbert A, Zaumseil, Peter, Reich, Christian, Capellini, Giovanni, Montalenti, Francesco, Marzegalli, Anna, Xie, Ya-Hong, Schülli, Tobias U, Häberlen, Maik, Storck, Peter, Schroeder, Thomas

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Structural Mapping of Functional Ge Layers Grown on Graded SiGe Buffers for sub-10 nm CMOS Applications Using Advanced X‑ray Nanodiffraction von Richard, Marie-Ingrid, Zoellner, Marvin H, Chahine, Gilbert A, Zaumseil, Peter, Capellini, Giovanni, Häberlen, Maik, Storck, Peter, Schülli, Tobias U, Schroeder, Thomas

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Structural transitions of epitaxial ceria films on Si(111) von Wilkens, H, Schuckmann, O, Oelke, R, Gevers, S, Reichling, M, Schaefer, A, Bäumer, M, Zoellner, M. H, Niu, G, Schroeder, T, Wollschläger, J

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Morphology and nanostructure of CeO2(111) surfaces of single crystals and Si(111) supported ceria films von PIEPER, H. H, DERKS, C, ZOELLNER, M. H, OLBRICH, R, TRÖGER, L, SCHROEDER, T, NEUMANN, M, REICHLING, M

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Nanoscale Mapping of the 3D Strain Tensor in a Germanium Quantum Well Hosting a Functional Spin Qubit Device von Corley-Wiciak, Cedric, Richter, Carsten, Zoellner, Marvin H., Zaitsev, Ignatii, Manganelli, Costanza L., Zatterin, Edoardo, Schülli, Tobias U., Corley-Wiciak, Agnieszka A., Katzer, Jens, Reichmann, Felix, Klesse, Wolfgang M., Hendrickx, Nico W., Sammak, Amir, Veldhorst, Menno, Scappucci, Giordano, Virgilio, Michele, Capellini, Giovanni

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Surface morphology of ultrathin hex-Pr2O3 films on Si(1 1 1) von Wilkens, H, Rodewald, J, Gevers, S, Zoellner, M H, Schroeder, T, Wollschläger, J

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TrackPad: Software for semi-automated single-cell tracking and lineage annotation von Cornwell, J.A., Li, J., Mahadevan, S., Draper, J.S., Joun, G.L., Zoellner, H., Asli, N.S., Harvey, R.P., Nordon, R.E.

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novel primate model of delayed wound healing in diabetes: dysregulation of connective tissue growth factor von Thomson, S. E, McLennan, S. V, Hennessy, A, Boughton, P, Bonner, J, Zoellner, H, Yue, D. K, Twigg, S. M

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Characterization and prevention of humidity related degradation of atomic layer deposited Al2O3 von Rückerl, Andreas, Zeisel, Roland, Mandl, Martin, Costina, Ioan, Schroeder, Thomas, Zoellner, Marvin H.

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Effects of pulsed electromagnetic field vibration on tooth movement induced by magnetic and mechanical forces: a preliminary study von Darendeliler, M Ali, Zea, A., Shen, G., Zoellner, H.

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Controlling the relaxation mechanism of low strain Si1−xGex/Si(001) layers and reducing the threading dislocation density by providing a preexisting dislocation source von Becker, L., Storck, P., Schulz, T., Zoellner, M. H., Di Gaspare, L., Rovaris, F., Marzegalli, A., Montalenti, F., De Seta, M., Capellini, G., Schwalb, G., Schroeder, T., Albrecht, M.

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Carbon related hillock formation and its impact on the optoelectronic properties of GaN/AlGaN heterostructures grown on Si(111) von Tetzner, H., Sana, P., Klesse, W. M., Capellini, G., Schubert, M. A., Thapa, S. B., Storck, P., Schroeder, T., Zoellner, M. H.

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Full Picture of Lattice Deformation in a Ge1 − xSnx Micro‐Disk by 5D X‐ray Diffraction Microscopy von Corley‐Wiciak, Cedric, Zoellner, Marvin H., Corley‐Wiciak, Agnieszka A., Rovaris, Fabrizio, Zatterin, Edoardo, Zaitsev, Ignatii, Sfuncia, Gianfranco, Nicotra, Giuseppe, Spirito, Davide, von den Driesch, Nils, Manganelli, Costanza L., Marzegalli, Anna, Schulli, Tobias U., Buca, Dan, Montalenti, Francesco, Capellini, Giovanni, Richter, Carsten

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Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy... von Chahine, G. A., Zoellner, M. H., Richard, M.-I., Guha, S., Reich, C., Zaumseil, P., Capellini, G., Schroeder, T., Schülli, T. U.

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Full Picture of Lattice Deformation in a Ge 1 - x Sn x Micro-Disk by 5D X-ray Diffraction Microscopy von Corley-Wiciak, Cedric, Zoellner, Marvin H, Corley-Wiciak, Agnieszka A, Rovaris, Fabrizio, Zatterin, Edoardo, Zaitsev, Ignatii, Sfuncia, Gianfranco, Nicotra, Giuseppe, Spirito, Davide, von den Driesch, Nils, Manganelli, Costanza L, Marzegalli, Anna, Schulli, Tobias U, Buca, Dan, Montalenti, Francesco, Capellini, Giovanni, Richter, Carsten

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A well-structured metastable ceria surface von Olbrich, R., Pieper, H. H., Oelke, R., Wilkens, H., Wollschläger, J., Zoellner, M. H., Schroeder, T., Reichling, M.

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Zero lattice mismatch and twin-free single crystalline ScN buffer layers for GaN growth on silicon von Lupina, L., Zoellner, M. H., Niermann, T., Dietrich, B., Capellini, G., Thapa, S. B., Haeberlen, M., Lehmann, M., Storck, P., Schroeder, T.

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Tailoring the strain in Si nano-structures for defect-free epitaxial Ge over growth von Zaumseil, P, Yamamoto, Y, Schubert, M A, Capellini, G, Skibitzki, O, Zoellner, M H, Schroeder, T

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