Modeling bimodal electromigration failure distributions von Fischer, A.H, Abel, A, Lepper, M, Zitzelsberger, A.E, von Glasow, A

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The quantitative assessment of stress-induced voiding in process qualification von Fischer, A.H., Zitzelsberger, A.E.

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Experimental data and statistical models for bimodal EM failures von Fischer, A.H., Abel, A., Lepper, M., Zitzelsberger, A.E., von Glasow, A.

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On the bimodal lognormal distribution of electromigration lifetimes von Lepper, M., Fischer, A.H., Zitzelsberger, A.E.

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A correlation between highly accelerated Wafer Level and standard Package Level electromigration tests on deep sub-micron via-line structures von Lepper, M., Bauer, R., Zitzelsberger, A.E.

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PH-0237: Radiotherapy-induced mesenchymal gene signatures attenuated by VEGF-A blockade in mouse glioblastoma von Nieto, A.E., Unger, K., Fleischmann, D., Piehlmaier, D., Albrecht, V., Maas, J., Proescholdt, M., Zitzelsberger, H., Belka, C., Lauber, K.

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