ATTENUATED TOTAL REFLECTION SPECTRA OF NITRIDED Si[O.sub.2]/Si STRUCTURES von Odzhaev, V.B, Pyatlitski, A.N, Prosolovich, V.S, Kovalchuk, N.S, Soloviev, Ya. A, Zhygulin, D.V, Shestovsky, D.V, Yankovski, Yu.N, Brinkevich, D.I

Volltext

Surface morphology of Dy x O y films grown on Si von Lawniczak-Jablonska, K., Babushkina, N.V., Dynowska, E., Malyshev, S.A., Romanova, L.I., Zhygulin, D.V., Laiho, T.

Volltext

Charge properties of MIS structures Ni-Dy/sub x/O/sub y/-n-Si [100] von Babushkina, N.V., Malyshev, S.A., Romanova, L.I., Chizh, A.L., Zhygulin, D.V.

Volltext bestellen