Measurement of Freeform Optical Surfaces: Trade‐Off between Accuracy and Dynamic Range von Chen, Shanyong, Xue, Shuai, Zhai, Dede, Tie, Guipeng

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Review of self-referenced measurement algorithms： Bridging lateral shearing interferometry and multi-probe error separation von ZHAI, Dede, CHEN, Shanyong, YIN, Ziqiang, LI, Shengyi

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Quasi-absolute interferometric testing of cylinders von Chen, Shanyong, Dai, Yifan, Zhai, Dede, Xiong, Yupeng

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Novel scanning system with error separation for high-accuracy profile measurement von Guo, Jingyang, Zhai, Dede, Chen, Shanyong, Liu, Junfeng

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Flexible and high-resolution surface metrology based on stitching interference microscopy von Chen, Shanyong, Lu, Wenwen, Guo, Jingyang, Zhai, Dede, Chen, Weiwei

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Topography measurement of helical grooves on a hemisphere based on stitching interference microscopy von Guo, Jingyang, Zhai, Dede, Lu, Wenwen, Chen, Shanyong

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Characterization of diffractive relief structures over large areas by stitching interference microscopic topography von Lu, Wenwen, Chen, Shanyong, Zhang, Kai, Zhai, Dede

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Stitching interferometric characterization of geometric errors of hemispherical shells von Wang, Xu, Xue, Shuai, Chen, Shanyong, Zhai, Dede

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Misalignment measurement of membrane diffractive telescope segments by means of edge sensors with form closure von Chen, Shanyong, Wu, Chuanchao, Zhai, Dede, Liu, Junfeng

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Exact recovery of wavefront from multishearing interferograms in spatial domain von Zhai, Dede, Chen, Shanyong, Xue, Shuai, Yin, Ziqiang

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Absolute profile test by multi-sensor scanning system with relative angle measurement von Zhai, Dede, Chen, Shanyong, Peng, Xiaoqiang, Tie, Guipeng

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Quasi-absolute surface figure test with two orthogonal transverse spatial shifts von Xue, Shuai, Chen, Shanyong, Zhai, Dede, Shi, Feng

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Exact multi-shear reconstruction method with different tilts in spatial domain von Zhai, Dede, Chen, Shanyong, Shi, Feng, Yin, Ziqiang

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Pixel-based absolute surface metrology by three flat test with shifted and rotated maps von Zhai, Dede, Chen, Shanyong, Xue, Shuai, Yin, Ziqiang

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Composite lighting device and multi-sensor detection system von ZHU ZIYAN, CHEN HAO, SHEN XIAO, PENG XING, CAO HONGBING, ZHAI DEDE, SHI FENG

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Microwave neutralizer for plasma processing and application method thereof von GUO SHUANGPENG, TIAN YE, GONG BAOQI, SONG CI, ZHAI DEDE, SHI FENG, ZHANG JINGPENG

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In-situ measurement time-control grinding device and measurement method thereof von HU HAO, GUAN CHAOLIANG, SUN ZIZHOU, ZHAI DEDE, DAI YIFAN, CHEN SHANYONG

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High-precision spatial light modulator diffraction wavefront modulation method and device von LIU JUNFENG, XUE SHUAI, DAI YIFAN, CHEN SHANYONG, ZHAI DEDE

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Closed-loop iterative compensation interference detection method, device and system von LIU JUNFENG, XUE SHUAI, DAI YIFAN, CHEN SHANYONG, ZHAI DEDE

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Complex surface fly's-eye lens manufacturing method and detection device von WANG SHANSHAN, HAO QUN, QIAO SHUO, WANG ZHEKAI, PENG XING, HU YAO, ZHAI DEDE, SHI FENG

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