Structure determination of the indium induced Si(001)-(4 × 3) reconstruction by surface X-ray diffraction and scanning tunneling microscopy von Bunk, O., Falkenberg, G., Seehofer, L., Zeysing, J.H., Johnson, R.L., Nielsen, M., Feidenhans'l, R., Landemark, E.

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Structure determination of the Si(001)-(2×1)-H reconstruction by surface X-ray diffraction: weakening of the dimer bond by the addition of hydrogen von Lauridsen, E.M., Baker, J., Nielsen, M., Feidenhans'l, R., Falkenberg, G., Bunk, O., Zeysing, J.H., Johnson, R.L.

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Semiconductor on metal adsorption: Ge tetramers on the Ag(001) surface von Oughaddou, H, Aufray, B, Le Lay, G, Gay, J.M, Zeysing, J.H, Johnson, R.L, Barrett, N, Guillot, C

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Structure determination of the indium-induced Ge(103)-(1×1) reconstruction by surface X-ray diffraction von Bunk, O, Falkenberg, G, Zeysing, J.H, Lottermoser, L, Johnson, R.L, Nielsen, M, Berg-Rasmussen, F, Feidenhans'l, R

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