Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range von Renault, O., Zborowski, C., Risterucci, P., Wiemann, C., Grenet, G., Schneider, C. M., Tougaard, S.

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Analysis of buried interfaces in multilayer device structures with hard XPS (HAXPES) using a CrKα source von Renault, O., Martinez, E., Zborowski, C., Mann, J., Inoue, R., Newman, J., Watanabe, K.

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Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers von Risterucci, P., Renault, O., Zborowski, C., Bertrand, D., Torres, A., Rueff, J.-P., Ceolin, D., Grenet, G., Tougaard, S.

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Quantitative determination of elemental diffusion from deeply buried layers by photoelectron spectroscopy von Zborowski, C., Renault, O., Torres, A., Guedj, C., Yamashita, Y., Ueda, S., Grenet, G., Tougaard, S.

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Comparison and complementarity of QUASES-Tougaard and SESSA software von Zborowski, C., Vanleenhove, A., Conard, T.

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Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (4): Group III and IV elements (B, Al, In, C, Si, Ge, Sn, Pb) von Zborowski, C., Conard, T., Vanleenhove, A., Hoflijk, I., Vaesen, I.

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Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample von Zborowski, C., Renault, O., Torres, A., Yamashita, Y., Grenet, G., Tougaard, S.

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Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (5): Various elements (Mg, Sb, Bi, Se, Gd, Dy, Yb) von Zborowski, C., Conard, T., Vanleenhove, A., Hoflijk, I., Vaesen, I.

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Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (3): Transition metals period 6 elements (Hf, Ta, W, Re, Ir, Pt, Au) von Zborowski, C., Conard, T., Vanleenhove, A., Hoflijk, I., Vaesen, I.

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Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (1): Transition metals period 4 elements (Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Z... von Zborowski, C., Conard, T., Vanleenhove, A., Hoflijk, I., Vaesen, I.

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Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (2): Transition metals period 5 elements (Y, Zr, Nb, Mo, Ru, Rh, Pd, and Ag) von Zborowski, C., Conard, T., Vanleenhove, A., Hoflijk, I., Vaesen, I.

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HAXPES Cr Kα measurement of bulk indium von Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T.

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HAXPES Cr Kα measurement of bulk germanium von Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T.

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HAXPES Cr Kα measurement of bulk hafnium von Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T.

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High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk chromium von Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T.

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High energy x-ray photoelectron spectroscopy Cr Kα measurement of bulk gadolinium von Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T.

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High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk Ag von Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T.

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High-energy x-ray photoelectron spectroscopy Cr Kα measurement of bulk dysprosium von Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T.

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High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk copper von Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T.

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High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk gold von Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T.

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