Structural and optical characterization of Ba0.8Sr0.2TiO3 PLD deposited films von Aulika, I., Pokorny, J., Zauls, V., Kundzins, K., Rutkis, M., Petzelt, J.

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Thermo-optical studies of NaNbO3 thin films von Aulika, I, Deyneka, A, Zauls, V, Kundzins, K

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Broadband dielectric spectroscopy of PSN ceramics von Grigalaitis, R., Banys, J., Sternberg, A., Bormanis, K., Zauls, V.

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STRUCTURAL AND OPTICAL STUDIES OF NaNbO3 THIN FILMS GROWN BY PLD ON SrRuO3 BOTTOM ELECTRODE von Aulika, I, Petzelt, J, Pokorny, J, Deyneka, A, Zauls, V, Kundzins, K

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Dielectric spectroscopy and distribution of relaxation times of PMN-PSN ceramics von GRIGALAITIS, R, BANYS, J, BRILINGAS, A, MIKONIS, A, BORMANIS, K, STERNBERG, A, ZAULS, V

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Antiferroelectric PbZrO3 thin films: structure, properties and irradiation effects von Sternberg, A., Kundzins, K., Zauls, V., Aulika, I., Čakare, L., Bittner, R., Weber, H., Humer, K., Lesnyh, D., Kulikov, D., Trushin, Y.

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Distribution of relaxation times in 0.5PMN-0.5PSN ceramics von Grigalaitis, R, Banys, J, Brilingas, A, Sternberg, A, Bormanis, K, Zauls, V

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Sensitivity analysis of ellipsometry applied to uniaxial optical films von Flueraru, C., Schrader, S., Motschmann, H., Zauls, V.

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Characterization and Modeling of Cis−Trans Photoisomerization of a Trifluoromethoxy-Substituted Metacrylate Copolymer Monolayer at a Fluid Interface von Wüstneck, R, Fainerman, V. B, Zauls, V

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Distribution of the relaxation times of the new relaxor 0.4PSN–0.3PMN–0.3PZN ceramics von Macutkevic, J., Lapinskas, S., Grigas, J., Brilingas, A., Banys, J., Grigalaitis, R., Meskonis, K., Bormanis, K., Sternberg, A., Zauls, V.

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Anomalous Broad Dielectric Dispersion of 0.4PZN-0.3PSN-0.3PZN Relaxor Ceramics at Lower Temperatures von Brilingas, Algirdas, Zauls, Vismantas, Macutkevic, Jan, Banys, Juras, Bormanis, K., Sternberg, Andris, Samulionis, Vytautas

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Study Of Transparent Ferroelectric Thin Films By Optical Reflectometry And Ellipsometry von Aulika, I, Zauls, V, Kundzins, K, Kundzins, M, Katholy, S

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Ellipsometric and atomic force microscopic investigations on poly( para-phenylenevinylene) and poly(phenylquinoxaline) thin films von Flueraru, C, Schrader, S, Zauls, V, Motschmann, H, Stiller, B, Kiebooms, R

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Determination of molecular orientation by angular dependence of second harmonic intensity and second harmonic phase measurements von Flueraru, C., Schrader, S., Zauls, V., Dietzel, B., Motschmann, H.

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Optical Gradient of the Trapezium-Shaped NaNbO[sub 3] Thin Films Studied by Spectroscopic Ellipsometry von Aulika, I., Dejneka, A., Zauls, V., Kundzins, K.

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Effects of structure ordering, structure defects and external conditions on properties of complex ferroelectric perovskites von Sternberg, A., Shebanovs, L., Birks, E., Yamashita, Y., Tyunina, M., Zauls, V.

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Formation of Optical Gradient in Chemical Solution-Derived PbZr[sub 0.52]Ti[sub 0.48]O[sub 3] Thin Films: Spectroscopic Ellipsometry Investigation von Aulika, I., Corkovic, S., Bencan, A., D’Astorg, S., Dejneka, A., Zhang, Q., Kosec, M., Zauls, V.

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Thermo-optical studies of NaNbO 3 thin films von Aulika, I, Deyneka, A, Zauls, V, Kundzins, K

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Antiferroelectric PbZrO 3 thin films: structure, properties and irradiation effects von Sternberg, A., Kundzins, K., Zauls, V., Aulika, I., Čakare, L., Bittner, R., Weber, H., Humer, K., Lesnyh, D., Kulikov, D., Trushin, Y.

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Non-linear effects of light scattering in PLZT ceramics von Altshuler, G. B., Ermolayev, V. S., Hramov, V. Yu, Zauls, V., Liberts, G.

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