Hydrogen localization near boron in silicon von PANKOVE, J. I, ZANZUCCHI, P. J, MAGEE, C. W, LUCOVSKY, G

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Optical and photoconductive properties of discharge-produced amorphous silicon von Zanzucchi, P. J., Wronski, C. R., Carlson, D. E.

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Corrosion inhibitors for aluminum films von ZANZUCCHI, P. J, THOMAS, J. H. III

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Scandium oxide antireflection coatings for superluminescent LEDs von Ladany, I, Zanzucchi, P J, Andrews, J T, Kane, J, Depiano, E

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Heteroepitaxial Semiconductors for Electronic Devices von Cullen, G. W, Ban, V. S, Wang, Chao-cheng, Berkman, S, Blanc, J, Duffy, M. T, Goldsmith, N, Ham, W. E, Zanzucchi, P. J

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Polarized infrared transmittance of carbon black-polyvinylchloride composite von Balberg, I., Zanzucchi, P. J.

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Fourier transform infrared (FTIR) analysis of photoresist films on silicon wafers von PAMPALONE, T. R, GILFILLAN, A. M, ZANZUCCHI, P. J

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Surface damage and the optical reflectance of single-crystal silicon von Zanzucchi, P J, Duffy, M T

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Device for studying heat-induced surface reactions by infrared spectrometry von Zanzucchi, P. J, Frenchu, W. R

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Multisampling of microgram quantities for infrared spectrometric analysis von Zanzucchi, P. J, Frenchu, W. R

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Dielectric and Optical Properties of Stoichiometric Magnesium Aluminate Spinel Single Crystals von Wang, C. C., Zanzucchi, P. J.

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The role of plasma diffusion in heat dissipation during laser annealing von Jastrzebski, L., Bell, A. E., Wu, C. P., Zanzucchi, P. J.

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Epitaxially grown AlN and its optical band gap von Yim, W. M., Stofko, E. J., Zanzucchi, P. J., Pankove, J. I., Ettenberg, M., Gilbert, S. L.

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The role of hydrogen in heavily doped amorphous silicon von Carlson, D. E., Smith, R. W., Magee, C. W., Zanzucchi, P. J.

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Epitaxial Growth and Properties of GaAs on Magnesium Aluminate Spinel von Wang, C. C., Dougherty, F. C., Zanzucchi, P. J., McFarlane, S. H.

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Heteroepitaxial Semiconductors for Electronic Devices von Cullen, G. W, Ban, V. S, Wang, C. C, Berkman, S, Blanc, J, Duffy, M. T, Goldsmith, N, Ham, W. E, Zanzucchi, P. J

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Optical reflectance: a sensitive nondestructive method for detecting surface damage in crystalline GaAs and other semiconductors von Zanzucchi, P J, Frenchu, W R

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Light-induced effects in amorphous silicon material and devices von Carlson, D.E., Moore, A.R., Szostak, D.J., Goldstein, B., Smith, R.W., Zanzucchi, P.J., Frenchu, W.R.

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Epitaxial growth and piezoelectric properties of A1N, GaN, and GaAs on sapphire or spinel von Duffy, M. T., Wang, C. C., O’clock, G. D., McFarlane, S. H., Zanzucchi, P. J.

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Optical characterization of silicon and sapphire surfaces as related to SOS discrete device performance von Duffy, M.T., Zanzucchi, P.J., Ham, W.E., Corboy, J.F., Cullen, G.W., Smith, R.T.

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