Critical exponents and scaling invariance in the absence of a critical point von Saratz, N., Zanin, D. A., Ramsperger, U., Cannas, S. A., Pescia, D., Vindigni, A.

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Impact of deconditioning on the secondary electron yield of Cu surfaces in particle accelerators von Petit, V., Taborelli, M., Zanin, D. A., Neupert, H., Chiggiato, P., Belhaj, M.

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Controlling vortex chirality in hexagonal building blocks of artificial spin ice von Chopdekar, R V, Duff, G, Hügli, R V, Mengotti, E, Zanin, D A, Heyderman, L J, Braun, H B

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Non-topographic current contrast in scanning field emission microscopy von Bertolini, G., Gürlü, O., Pröbsting, R., Westholm, D., Wei, J., Ramsperger, U., Zanin, D. A., Cabrera, H., Pescia, D., Xanthakis, J. P., Schnedler, M., Dunin-Borkowski, R. E.

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Role of surface microgeometries on electron escape probability and secondary electron yield of metal surfaces von Bajek, D., Wackerow, S., Zanin, D. A., Baudin, L., Bogdanowicz, K., Valdivieso, E. Garcia-Tabares, Calatroni, S., Di Girolamo, B., Sitko, M., Himmerlich, M., Taborelli, M., Chiggiato, P., Abdolvand, A.

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Correction: Corrigendum: Critical exponents and scaling invariance in the absence of a critical point von Saratz, N., Zanin, D. A., Ramsperger, U., Cannas, S. A., Pescia, D., Vindigni, A.

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Corrigendum: Critical exponents and scaling invariance in the absence of a critical point von Saratz, N, Zanin, D A, Ramsperger, U, Cannas, S A, Pescia, D, Vindigni, A

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Coated conductor technology for the beamscreen chamber of future high energy circular colliders von Puig, T, Krkoti, P, Romanov, A, O'Callaghan, J, Zanin, D A, Neupert, H, Pinto, P C, Demolon, P, Costa, A Granadeiro, Taborelli, M, Perez, F, Pont, M, Gutierrez, J, Calatroni, S

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Scale invariance of a diodelike tunnel junction von Cabrera, H., Zanin, D. A., De Pietro, L. G., Michaels, Th, Thalmann, P., Ramsperger, U., Vindigni, A., Pescia, D., Kyritsakis, A., Xanthakis, J. P., Li, Fuxiang, Abanov, Ar

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Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy von Zanin, D. A., De Pietro, L. G., Peter, Q., Kostanyan, A., Cabrera, H., Vindigni, A., Bähler, Th, Pescia, D., Ramsperger, U.

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Scaling theory of electric-field-assisted tunnelling von Michaels, Thomas C. T., Cabrera, H., Zanin, D. A., De Pietro, L., Ramsperger, U., Vindigni, A., Pescia, D.

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Erythrocyte survival tests in cases of anti-AnWj antibodies von Van Gaalen, F. A., Zanin, D. E. A., Brand, A.

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Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy von Zanin, D. A., De Pietro, L. G., Peter, Q., Kostanyan, A., Cabrera, H., Vindigni, A., Bähler, Th, Pescia, D., Ramsperger, U.

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Scaling theory of electric-field-assisted tunnelling von Michaels, Thomas C. T., Cabrera, H., Zanin, D. A., De Pietro, L., Ramsperger, U., Vindigni, A., Pescia, D.

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Scale invariance of a diodelike tunnel junction von Cabrera, H, Zanin, D A, De Pietro, L G, Michaels, Th, Thalmann, P, Ramsperger, U, Vindigni, A, Pescia, D, Kyritsakis, A, Xanthakis, J P, Li, Fuxiang, Abanov, Ar

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Critical exponents and scaling invariance in the absence of a critical point von Saratz, N, Zanin, D. A, Ramsperger, U, Cannas, S. A, Pescia, D, Vindigni, A

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critical-exponents von Zanin, Danilo Andrea

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The origin of power laws in electric field assisted tunneling von Cabrera, H., Zanin, D. A., De Pietro, L. G., Vindigni, A., Ramsperger, U., Pescia, D.

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Near Field-Emission SEM: Primary electron beam generation and comparison with STM von Zanin, D. A., Cabrera, H., De Pietro, L. G., Thalmann, M., Pescia, D., Ramsperger, U.

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Critical exponents and scaling invariance in the absence of a critical point von Saratz, N, Zanin, D A, Ramsperger, U, Cannas, S A, Pescia, D, Vindigni, A

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