Effects of temperature and doping concentration on the piezoresistive property of vanadium dioxide thin film von Inomata, Naoki, Usuda, Takuto, Yamamoto, Yuji, H. Zoellner, Marvin, Costina, Ioan, Ono, Takahito

Volltext

Current insights into the laboratory diagnosis of HIT von Bakchoul, T., Zöllner, H., Greinacher, A.

Volltext

Carbon related hillock formation and its impact on the optoelectronic properties of GaN/AlGaN heterostructures grown on Si(111) von Tetzner, H., Sana, P., Klesse, W. M., Capellini, G., Schubert, M. A., Thapa, S. B., Storck, P., Schroeder, T., Zoellner, M. H.

Volltext

Role of critical thickness in SiGe/Si/SiGe heterostructure design for qubits von Liu, Yujia, Gradwohl, Kevin-P., Lu, Chen-Hsun, Remmele, Thilo, Yamamoto, Yuji, Zoellner, Marvin H., Schroeder, Thomas, Boeck, Torsten, Amari, Houari, Richter, Carsten, Albrecht, Martin

Volltext

Post deposition annealing of epitaxial Ce1−xPrxO2−δ films grown on Si(111) von Wilkens, H, Spieß, W, Zoellner, M. H, Niu, G, Schroeder, T, Wollschläger, J

Volltext

Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X‑ray Diffraction Microscopy von Zoellner, Marvin H, Richard, Marie-Ingrid, Chahine, Gilbert A, Zaumseil, Peter, Reich, Christian, Capellini, Giovanni, Montalenti, Francesco, Marzegalli, Anna, Xie, Ya-Hong, Schülli, Tobias U, Häberlen, Maik, Storck, Peter, Schroeder, Thomas

Volltext

Lattice-matched epitaxial ternary PrxY2−xO3 films on SrO-passivated Si (001): Interface engineering and crystallography tailoring von Niu, G., Zaumseil, P., Schubert, M. A., Zoellner, M. H., Dabrowski, J., Schroeder, T.

Volltext

Structural Mapping of Functional Ge Layers Grown on Graded SiGe Buffers for sub-10 nm CMOS Applications Using Advanced X‑ray Nanodiffraction von Richard, Marie-Ingrid, Zoellner, Marvin H, Chahine, Gilbert A, Zaumseil, Peter, Capellini, Giovanni, Häberlen, Maik, Storck, Peter, Schülli, Tobias U, Schroeder, Thomas

Volltext

Structural transitions of epitaxial ceria films on Si(111) von Wilkens, H, Schuckmann, O, Oelke, R, Gevers, S, Reichling, M, Schaefer, A, Bäumer, M, Zoellner, M. H, Niu, G, Schroeder, T, Wollschläger, J

Volltext

Morphology and nanostructure of CeO2(111) surfaces of single crystals and Si(111) supported ceria films von PIEPER, H. H, DERKS, C, ZOELLNER, M. H, OLBRICH, R, TRÖGER, L, SCHROEDER, T, NEUMANN, M, REICHLING, M

Volltext

Nanoscale Mapping of the 3D Strain Tensor in a Germanium Quantum Well Hosting a Functional Spin Qubit Device von Corley-Wiciak, Cedric, Richter, Carsten, Zoellner, Marvin H., Zaitsev, Ignatii, Manganelli, Costanza L., Zatterin, Edoardo, Schülli, Tobias U., Corley-Wiciak, Agnieszka A., Katzer, Jens, Reichmann, Felix, Klesse, Wolfgang M., Hendrickx, Nico W., Sammak, Amir, Veldhorst, Menno, Scappucci, Giordano, Virgilio, Michele, Capellini, Giovanni

Volltext

Surface morphology of ultrathin hex-Pr2O3 films on Si(1 1 1) von Wilkens, H, Rodewald, J, Gevers, S, Zoellner, M H, Schroeder, T, Wollschläger, J

Volltext

TrackPad: Software for semi-automated single-cell tracking and lineage annotation von Cornwell, J.A., Li, J., Mahadevan, S., Draper, J.S., Joun, G.L., Zoellner, H., Asli, N.S., Harvey, R.P., Nordon, R.E.

Volltext

High-resolution seismic analysis of the coastal Mecklenburg Bay (North German Basin): the pre-Alpine evolution von Zöllner, H., Reicherter, K., Schikowsky, P.

Volltext

novel primate model of delayed wound healing in diabetes: dysregulation of connective tissue growth factor von Thomson, S. E, McLennan, S. V, Hennessy, A, Boughton, P, Bonner, J, Zoellner, H, Yue, D. K, Twigg, S. M

Volltext

Reaching the Unreached: Bridging Islam and Science to Treat the Mental Wounds of War von Zoellner, Lori A., Bentley, Jacob A., Feeny, Norah C., Klein, Alexandra B., Dolezal, Michael L., Angula, Dega A., Egeh, Momin H.

Volltext

Effects of pulsed electromagnetic field vibration on tooth movement induced by magnetic and mechanical forces: a preliminary study von Darendeliler, M Ali, Zea, A., Shen, G., Zoellner, H.

Volltext

Characterization and prevention of humidity related degradation of atomic layer deposited Al2O3 von Rückerl, Andreas, Zeisel, Roland, Mandl, Martin, Costina, Ioan, Schroeder, Thomas, Zoellner, Marvin H.

Volltext

Controlling the relaxation mechanism of low strain Si1−xGex/Si(001) layers and reducing the threading dislocation density by providing a preexisting dislocation source von Becker, L., Storck, P., Schulz, T., Zoellner, M. H., Di Gaspare, L., Rovaris, F., Marzegalli, A., Montalenti, F., De Seta, M., Capellini, G., Schwalb, G., Schroeder, T., Albrecht, M.

Volltext

Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy... von Chahine, G. A., Zoellner, M. H., Richard, M.-I., Guha, S., Reich, C., Zaumseil, P., Capellini, G., Schroeder, T., Schülli, T. U.

Volltext