An EDA-based Judgment Method for Circuit Fault Simulation von Jin, Qi, Guangyan, Zhao, Yufeng, Sun

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Research on Data Mining Methods in the Field of Quality Problem Analysis Based on BERT Model von Ding, Zihuan, Zhao, Guangyan

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A Determination Method of Storage Performance Attribute Parameter von Zhao, Guang Yan, Zhao, Gang, Sun, Yu Feng

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A QFD-AHP-Based Approach for Determining Storage Performance Parameters von Zhao, Guang Yan, Liu, Wei, Sun, Yu Feng

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Research on Interfacial Diffusion Reliability Model of Thin Film Thermocouple von Xue, Yu Qing, Zhao, Guang Yan, Lei, Dong Yang, Sun, Yu Feng

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Thermal and Vibration Mechanical Reliability of Multicoat Compound Thin-Film Thermocouple von Hu, Ting Chun, Xi, Yi Yun, Zhao, Guang Yan, Sun, Yu Feng

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The Method of FMEA and FTA Based on System Fault Behavior Model von Zhao, Guang Yan

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Time-Dependent Density Functional Theory Study on the Electronic Excited State of Hydrogen-Bonded Clusters Formed by 2-Hydroxybenzonitrile (o-Cyanophenol) and Carbon Monoxide von Zhang, Jiazuo, Zhao, Guangyan, Li, Ruizhou, Hou, Dongyu

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A Circuit Fault Inference Method Based on Topological Structure von -, Guangyan Zhao, -, Yufeng Sun, -, Xiaoyi Han

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Study on constellation per-slot availability von Guangyan Zhao, Yufeng Sun, Weiwei Hu, Tong Qin

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A comparison and case studies of electronic product reliability prediction methods based on handbooks von Haowen Mou, Weiwei Hu, Yufeng Sun, Guangyan Zhao

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Ligation of 5′ DNA Overhangs to 3′ DNA Overhangs Using Short Single-Stranded Oligonucleotide Linkers von Zhao, Guangyan, Hortsch, Michael

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The qualitative modeling method of fault propagation in electronic components von Chen Chen, Guangyan Zhao, Yufeng Sun, Xiaoxue Ding

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Study on QFD-based primary selection method for test signals von Yinghua Li, Guangyan Zhao, Weiwei Hu

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Thermal simulation of stirling cooler in IR system based on Flotherm von Yaqiu Li, Guangyan Zhao, Yufeng Sun

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Simulation on missile availability with consideration to storage process von Yaqiu Li, Guangyan Zhao, Yufeng Sun, Weiwei Hu

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A Canary Design to Monitor Electromigration of Solder Joints von W. Hu, H. Mou, Y. Sun, G. Zhao

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Sensitivity Analysis for the Dependence of Solder Joints Fatigue Life von W. Hu, C. Liu, Y. Sun, G. Zhao

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System fault behavior model von Guangyan Zhao, Gang Zhao

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System Fault Behavior Model Considering the Effects of Structural Factors and Method of Its Description von Zhao Guangyan, Kang Rui, Sun Yufeng, Zhao Gang

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