In situ thermal-microstructure characterization of a phase-transforming alloy satisfying cofactor conditions von Zeng, Zhuohui, Chen, Xian

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Retraction notice to “Study of strain-driven martensitic phase transformation rate via data-driven approach” [Phys. Lett. A 384 (2020) 126735] von Zeng, Zhuohui, Guo, Wei, Wu, Gangpeng, Zhu, Zeyuan, Zhang, Chenbo

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RETRACTED: Study of strain-driven martensitic phase transformation rate via data-driven approach von Zeng, Zhuohui, Guo, Wei, Wu, Gangpeng, Zhu, Zeyuan, Zhang, Chenbo

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Quantitative surface topography of martensitic microstructure by differential interference contrast microscopy von Zeng, Zhuohui, Zhang, Chenbo, Du, Shengwang, Chen, Xian

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Two-Tier Compatibility of Superelastic Bicrystal Micropillar at Grain Boundary von Karami, Mostafa, Zhu, Zeyuan, Zeng, Zhuohui, Tamura, Nobumichi, Yang, Yong, Chen, Xian

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In situ characterization of buckling dynamics in silicon microribbon on an elastomer substrate von Zeng, Zhuohui, Yu, Hongyu, Chen, Xian

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Energy Conversion from Heat to Electricity by Highly Reversible Phase-Transforming Ferroelectrics von Zhang, Chenbo, Zeng, Zhuohui, Zhu, Zeyuan, Tamura, Nobumichi, Chen, Xian

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Impact of Leakage for Electricity Generation by Pyroelectric Converter von Zhang, Chenbo, Zeng, Zhuohui, Zhu, Zeyuan, Karami, Mostafa, Chen, Xian

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Measuring optical beam shear angle of polarizing prisms beyond the diffraction limit with localization method von Chiu, Hoi Chun, Zeng, Zhuohui, Zhao, Luwei, Zhao, Teng, Du, Shengwang, Chen, Xian

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Dual beam-shear differential interference microscopy for full-field surface deformation gradient characterization von Zeng, Zhuohui, Chiu, Hoi-Chun, Zhao, Luwei, Zhao, Teng, Zhang, Chenbo, Karami, Mostafa, Yu, Hongyu, Du, Shengwang, Chen, Xian

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SAMPLE VESSEL WITH FEP THIN FILM FOR HOLDING BIOLOGICAL SAMPLE IN OPTICAL MICROSCOPY INSPECTION von ZHAO, Teng, ZHAO, Luwei, ZENG, Zhuohui

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Energy conversion from heat to electricity by highly reversible phase-transforming ferroelectrics von Zhang, Chenbo, Zeng, Zhuohui, Zhu, Zeyuan, Tamura, Nobumichi, Chen, Xian

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Impact of Leakage for Electricity Generation by Pyroelectric Converter von Zhang, Chenbo, Zeng, Zhuohui, Zhu, Zeyuan, Karami, Mostafa, Chen, Xian

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Precise characterization of polarizing prisms by optical localization analysis von Chiu, Hoi Chun, Zeng, Zhuohui, Zhao, Luwei, Zhao, Teng, Du, Shengwang, Chen, Xian

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Defect detection method and system for microscope lens production von HAN SHAOBO, ZENG ZHUOHUI, WU WENSHUAI, ZHAO LUWEI, HUANG GUOFENG, ZHANG CHONG

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METHODS AND SYSTEMS FOR MEASURING OPTICAL SHEAR OF BIREFRINGENT DEVICES BEYOND DIFFRACTION LIMIT von ZHAO, Teng, ZHAO, Luwei, ZENG, Zhuohui, CHIU, Hoi Chun, DU, Shengwang, CHEN, Xian

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Microscope production and assembly equipment von HAN SHAOBO, ZENG ZHUOHUI, ZHAO LUWEI, HUANG GUOFENG, ZHANG CHONG, WEI QI

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Optical microscope processing equipment von HAN SHAOBO, ZENG ZHUOHUI, ZHAO TENG, ZHAO LUWEI, WU WENSHUAI, WEI QI

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Precise characterization of polarizing prisms by optical localization analysis von Chiu, Hoi Chun, Zeng, Zhuohui, Zhao, Luwei, Zhao, Teng, Du, Shengwang, Chen, Xian

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METHODS AND SYSTEMS FOR MEASURING OPTICAL SHEAR OF BIREFRINGENT DEVICES BEYOND DIFFRACTION LIMIT von ZENG ZHUOHUI, QIU HECHUN, ZHAO TENG, DU SHENGWANG, ZHAO LUWEI, CHEN XIAN

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