Treffer 1 - 20 von 52 für Suche 'ZAYKOVA-FELDMAN LYUDMILA', Suchdauer: 0,83s Treffer weiter einschränken
  1. 1
    Cassette-based in-situ TEM sample inspection in the dual-beam FIB

    Cassette-based in-situ TEM sample inspection in the dual-beam FIB von Kendrick, A B, Moore, T M, Zaykova-Feldman, L, Amador, G, Hammer, M


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  2. 2
    Mechanical Conversion for High-Throughput TEM Sample Preparation

    Mechanical Conversion for High-Throughput TEM Sample Preparation von Kendrick, Anthony B, Moore, Thomas M, Zaykova-Feldman, Lyudmila


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  3. 3
    METHOD AND APPARATUS FOR THE AUTOMATED PROCESS OF IN-SITU LIFT-OUT

    METHOD AND APPARATUS FOR THE AUTOMATED PROCESS OF IN-SITU LIFT-OUT von ZAYKOVA-FELDMAN, Lyudmila, MOORE, Thomas, M

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  4. 4
    Method for stem sample inspection in a charged particle beam instrument

    Method for stem sample inspection in a charged particle beam instrument von Hammer Matthew, Moore Thomas M, Amador Gonzalo, Zaykova-Feldman Lyudmila

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  5. 5
    METHOD AND APPARATUS FOR THE MONITORING OF SAMPLE MILLING IN A CHARGED PARTICLE INSTRUMENT

    METHOD AND APPARATUS FOR THE MONITORING OF SAMPLE MILLING IN A CHARGED PARTICLE INSTRUMENT von MOORE, THOMAS, ZAYKOVA-FELDMAN, LYUDMILA, AMADOR, GONZALO

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  6. 6
    METHOD AND APPARATUS FOR THE MONITORING OF SAMPLE MILLING IN A CHARGED PARTICLE INSTRUMENT

    METHOD AND APPARATUS FOR THE MONITORING OF SAMPLE MILLING IN A CHARGED PARTICLE INSTRUMENT von MOORE, THOMAS, ZAYKOVA-FELDMAN, LYUDMILA, AMADOR, GONZALO

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  7. 7
    Method for automated stress testing of flip-chip packages

    Method for automated stress testing of flip-chip packages von Zaykova-Feldman, Lyudmila, Moore, Thomas M

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  8. 8
    Method for automated stress testing of flip-chip packages

    Method for automated stress testing of flip-chip packages von MOORE THOMAS M, ZAYKOVA-FELDMAN LYUDMILA

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  9. 9
    APPARATUS AND METHOD OF DETECTING PROBE TIP CONTACT WITH A SURFACE

    APPARATUS AND METHOD OF DETECTING PROBE TIP CONTACT WITH A SURFACE von MOORE, THOMAS, M, ZAYKOVA-FELDMAN, LYUDMILA

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  10. 10
    METHOD AND APPARATUS FOR IN-SITU PROBE TIP REPLACEMENT INSIDE A CHARGED PARTICLE BEAM MICROSCOPE

    METHOD AND APPARATUS FOR IN-SITU PROBE TIP REPLACEMENT INSIDE A CHARGED PARTICLE BEAM MICROSCOPE von ZAYKOVA-FELDMAN, LYUDMILA, MOORE, THOMAS M

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  11. 11
    Method for stem sample inspection in a charged particle beam instrument

    Method for stem sample inspection in a charged particle beam instrument von Zaykova-Feldman, Lyudmila, Moore, Thomas M, Amador, Gonzalo, Hammer, Matthew

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  12. 12
    Method for stem sample inspection in a charged particle beam instrument

    Method for stem sample inspection in a charged particle beam instrument von HAMMER MATTHEW, MOORE THOMAS M, AMADOR GONZALO, ZAYKOVA-FELDMAN LYUDMILA

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  13. 13
    Apparatus and method of detecting probe tip contact with a surface

    Apparatus and method of detecting probe tip contact with a surface von Moore, Thomas, Zaykova-Feldman, Lyudmila

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  14. 14
    Apparatus and method of detecting probe tip contact with a surface

    Apparatus and method of detecting probe tip contact with a surface von MOORE THOMAS, ZAYKOVA-FELDMAN LYUDMILA

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  15. 15
    Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument

    Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument von Zaykova-Feldman, Lyudmila, Moore, Thomas M, Amador, Gonzalo

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  16. 16
    Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument

    Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument von MOORE THOMAS M, AMADOR GONZALO, ZAYKOVA-FELDMAN LYUDMILA

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  17. 17
    METHOD AND APPARATUS FOR THE AUTOMATED PROCESS OF IN-SITU LIFT-OUT

    METHOD AND APPARATUS FOR THE AUTOMATED PROCESS OF IN-SITU LIFT-OUT von MOORE, THOMAS, M, ZAYKOVA-FELDMAN, LYUDMILA

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  18. 18
    Method for stem sample inspection in a charged particle beam instrument

    Method for stem sample inspection in a charged particle beam instrument von HAMMER MATTHEW, MOORE THOMAS M, AMADOR GONZALO, ZAYKOVA-FELDMAN LYUDMILA

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  19. 19
    Method for stem sample inspection in a charged particle beam instrument

    Method for stem sample inspection in a charged particle beam instrument von Zaykova-Feldman, Lyudmila, Moore, Thomas M, Amador, Gonzalo, Hammer, Matthew

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  20. 20
    Apparatus and method of detecting probe tip contact with a surface

    Apparatus and method of detecting probe tip contact with a surface von MOORE THOMAS, ZAYKOVA-FELDMAN LYUDMILA

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