Soft X-ray emission spectroscopy used for the characterization of a-C and CNx thin films von Nepijko, S.A., Chernenkaya, A., Medjanik, K., Chernov, S.V., Klimenkov, M., Vlasenko, O.V., Petrovskaya, S.S., Odnodvorets, L.V., Zaulichnyy, Ya.V., Schönhense, G.

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STRUCTURAL EFFECTS IN ULTRAFINE DIAMOND UNDER THERMAL AND THERMAL-BARIC ACTIONS von BYKOV, A.I., ZAULICHNYY, Ya.V., ISAEVA, L.P., KLOCHKOV, L.A., KOVALEV, A.V., LOBUNETS, T.F., MOROZOVA, R.A., OLEYNIK, G.S., ROGOZINSKAYA, A.A., TIMOFEEVA, I.I., TOMILA, T.V.

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