Defect tolerance in VLSI circuits: techniques and yield analysis von Koren, I., Koren, Z.

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Improved image accuracy in Hot Pixel degraded digital cameras von Chapman, Glenn H., Thomas, Rohit, Koren, Israel, Koren, Zahava

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Tradeoffs in Imager Design with Respect to Pixel Defect Rates von Chapman, Glenn H., Leung, Jenny, Koren, Israel, Koren, Zahava

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Automatic Detection of In-field Defect Growth in Image Sensors von Leung, J., Chapman, G.H., Koren, I., Koren, Z.

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Relating digital imager defect rates to pixel size, sensor area and ISO von Chapman, G. H., Thomas, R., Koren, I., Koren, Z.

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Quantitative analysis of in-field defects in image sensor arrays von Leung, J., Dudas, J., Chapman, G.H., Koren, I., Koren, Z.

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Predicting Pixel Defect Rates Based on Image Sensor Parameters von Chapman, G. H., Leung, J., Namburete, A., Koren, I., Koren, Z.

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Characterization of Gain Enhanced In-Field Defects in Digital Imagers von Leung, J., Chapman, G.H., Koren, I., Koren, Z.

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Incorporating yield enhancement into the floorplanning process von Koren, I., Koren, Z.

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Hot Pixel Behavior as Pixel Size Reduces to 1 micron von Chapman, Glenn H., Thomas, Rahul, Koren, Israel, Koren, Zahava

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Image degradation from hot pixel defects with pixel size shrinkage von Chapman, Glenn H, Thomas, Rohan, Meneses, Klinsmann J. C. S, Koren, Israel, Koren, Zahava

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On-Line Mapping of In-Field Defects in Image Sensor Arrays von Dudas, J., Jung, C., Wu, L., Chapman, G.H., Koren, I., Koren, Z.

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Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels von Chapman, Glenn H., Thomas, Rohan, Meneses, Klinsmann J. C. S., Purbakht, Parham, Koren, Israel, Koren, Zahava

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On the effect of floorplanning on the yield of large area integrated circuits von Koren, Z., Koren, I.

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A unified negative-binomial distribution for yield analysis of defect-tolerant circuits von Koren, I., Koren, Z., Stepper, C.H.

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A statistical study of defect maps of large area VLSI IC's von Koren, I., Koren, Z., Stapper, C.H.

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On-line identification of faults in fault-tolerant imagers von Chapman, G.H., Koren, I., Koren, Z., Dudas, J., Jung, C.

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Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes von Chapman, Glenn H, Thomas, Rahul, Thomas, Rohan, Coelho, Klinsmann J, Meneses, Silva, Yang, Tommy Q, Koren, Israel, Koren, Zahava

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A self-correcting active pixel camera von Koren, I., Chapman, G., Koren, Z.

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Performance and design evaluation of WDM stars von GANZ, A, KOREN, Z

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