Thermal magnetic field noise limits resolution in transmission electron microscopy von Uhlemann, Stephan, Müller, Heiko, Hartel, Peter, Zach, Joachim, Haider, Max

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Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV von Linck, Martin, Hartel, Peter, Uhlemann, Stephan, Kahl, Frank, Müller, Heiko, Zach, Joachim, Haider, Max, Niestadt, Marcel, Bischoff, Maarten, Biskupek, Johannes, Lee, Zhongbo, Lehnert, Tibor, Börrnert, Felix, Rose, Harald, Kaiser, Ute

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Aberration correction in a low voltage SEM by a multipole corrector von Zach, Joachim, Haider, Maximilian

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Thermal magnetic field noise: Electron optics and decoherence von Uhlemann, Stephan, Müller, Heiko, Zach, Joachim, Haider, Max

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Aberration correction and its automatic control in scanning electron microscopes von Uno, Shinobu, Honda, Kazuhiro, Nakamura, Natsuko, Matsuya, Miyuki, Zach, Joachim

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Aplanatic imaging systems for the transmission electron microscope von Müller, Heiko, Maßmann, Ingo, Uhlemann, Stephan, Hartel, Peter, Zach, Joachim, Haider, Maximilian

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Overview of Commercially Available CEOS Hexapole-type Aberration Correctors von Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Zach, Joachim, Haider, Max

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Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV von Linck, Martin, Hartel, Peter, Uhlemann, Stephan, Kahl, Frank, Müller, Heiko, Zach, Joachim, Biskupek, Johannes, Niestadt, Marcel, Kaiser, Ute, Haider, Max

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Resolution limits in low voltage scanning electron microscopes using retarding objective lenses von Zach, Joachim

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Corrector von Zach, Joachim

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Corrector von ZACH JOACHIM

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CORRECTOR von ZACH JOACHIM

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Corrector von ZACH JOACHIM

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Particle optical corrector for axial and off-axis beam path von ZACH, JOACHIM, ROSE, HARALD

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pi$/2 Mode Converters and Vortex Generators for Electrons von Kramberger, Christian, Löffler, Stefan, Schachinger, Thomas, Hartel, Peter, Zach, Joachim, Schattschneider, Peter

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Phase plate, imaging method, and electron microscope von Zach, Joachim

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Phase plate, imaging method, and electron microscope von ZACH JOACHIM

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Particle optical corrector for axial and off-axis beam path von ZACH, JOACHIM, ROSE, HARALD

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Corrector von UHLEMANN, STEPHAN, ZACH, JOACHIM

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First application of C[sub]c-corrected imaging for high-resolution and energy-filtered TEM von Kabius, Bernd, Hartel, Peter, Haider, Maximilian, Müller, Heiko, Uhlemann, Stephan, Loebau, Ulrich, Zach, Joachim, Rose, Harald

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