Temperature stabilization of a K110 variable energy cyclotron magnet von Kurashima, Satoshi, Yuyama, Takahiro, Okumura, Susumu

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Transverse profile shaping of a charged-particle beam using multipole magnets - Formation of hollow beams von Yuri, Yosuke, Fukuda, Mitsuhiro, Yuyama, Takahiro

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Characterization of a Gafchromic film for the two-dimensional profile measurement of low-energy heavy-ion beams von Yuri, Yosuke, Narumi, Kazumasa, Yuyama, Takahiro

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Use of a Gafchromic film HD-V2 for the profile measurement of energetic ion beams von Yuri, Yosuke, Ishizaka, Tomohisa, Agematsu, Takashi, Yuyama, Takahiro, Seito, Hajime, Okumura, Susumu

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Control of the size of etchable ion tracks in PVDF – Irradiation in an oxygen atmosphere and with fullerene C60 von Kitamura, Akane, Yamaki, Tetsuya, Yuri, Yosuke, Koshikawa, Hiroshi, Sawada, Shin-ichi, Yuyama, Takahiro, Usui, Aya, Chiba, Atsuya

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Study on ion irradiation response of Gafchromic films for the intensity distribution measurement of a large-area beam von Yuri, Yosuke, Ishizaka, Tomohisa, Yuyama, Takahiro, Ishibori, Ikuo, Okumura, Susumu

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Formation of hollow ion beams of various shapes using multipole magnets von Yuri, Yosuke, Fukuda, Mitsuhiro, Yuyama, Takahiro

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Formation of a large-area uniform ion beam using multipole magnets in the TIARA cyclotron von Yuri, Yosuke, Ishizaka, Tomohisa, Yuyama, Takahiro, Ishibori, Ikuo, Okumura, Susumu, Yoshida, Ken-ichi

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Microscopic evaluation of the absolute fluence distribution of a large-area uniform ion beam using the track-etching technique von Kitamura (Ogawa), Akane, Yamaki, Tetsuya, Yuri, Yosuke, Sawada, Shin-ichi, Yuyama, Takahiro

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Transformation of the Transverse Beam Intensity Distribution by Sextupole Focusing in a Transport Line von Yuri, Yosuke, Yuyama, Takahiro, Ishizaka, Tomohisa, Ishibori, Ikuo, Okumura, Susumu

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Useful technique for analysis and control of the acceleration beam phase in the azimuthally varying field cyclotron von Kurashima, Satoshi, Yuyama, Takahiro, Miyawaki, Nobumasa, Kashiwagi, Hirotsugu, Okumura, Susumu, Fukuda, Mitsuhiro

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Transformation of the Beam Intensity Distribution and Formation of a Uniform Ion Beam by Means of Nonlinear Focusing von YURI, Yosuke, YUYAMA, Takahiro, ISHIZAKA, Tomohisa, ISHIBORI, Ikuo, OKUMURA, Susumu

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Ion beam induced luminescence of lanthanide complexes in organic solvents irradiated by hydrogen and argon ion beams von Nakahara, Masaumi, Watanabe, Sou, Ishii, Yasuyuki, Yamagata, Ryohei, Yuri, Yosuke, Yuyama, Takahiro, Ishizaka, Tomohisa, Koka, Masashi, Yamada, Naoto, Hagura, Naoto

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Ion beam induced luminescence analysis of europium complexes in styrene-divinylbenzene copolymer-coated spherical silica by proton and argon ion beams irradiation von Nakahara, Masaumi, Watanabe, Sou, Takeuchi, Masayuki, Yuyama, Takahiro, Ishizaka, Tomohisa, Ishii, Yasuyuki, Yamagata, Ryohei, Yamada, Naoto, Koka, Masashi, Kada, Wataru, Hagura, Naoto

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Shaping ion beams into hollow profiles using sextupole magnets von Yuri, Yosuke, Yuyama, Takahiro, Ishizaka, Tomohisa, Fukuda, Mitsuhiro

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Transformation of the Transverse Beam Intensity Distribution by Sextupole Focusing in a Transport Line von Yuri, Yosuke, Yuyama, Takahiro, Ishizaka, Tomohisa, Ishibori, Ikuo, Okumura, Susumu

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Measurement Method of Ion-beam Relative Intensity Distribution Using γ-Ray Irradiation Response Function of Gafchromic Film HD-V2 von Ishizaka, Tomohisa, Yuri, Yosuke, Agematsu, Takashi, Yuyama, Takahiro, Seito, Hajime, Okumura, Susumu

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Quick change of ion species of heavy-ion microbeam by cocktail beam acceleration technique with the JAEA AVF cyclotron von Kurashima, Satoshi, Yoshida, Ken-ichi, Oikawa, Masakazu, Satoh, Takahiro, Miyawaki, Nobumasa, Yuyama, Takahiro, Okumura, Susumu, Kashiwagi, Hirotsugu, Ishibori, Ikuo, Nara, Takayuki, Kamiya, Tomihiro, Fukuda, Mitsuhiro, Yokota, Watalu

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Measurement Method of Ion-beam Relative Intensity Distribution Using γ-Ray Irradiation Response Function of Gafchromic Film HD-V2 von Ishizaka, Tomohisa, Yuri, Yosuke, Agematsu, Takashi, Yuyama, Takahiro, Seito, Hajime, Okumura, Susumu

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ガフクロミックフィルムHD-V2のγ線応答曲線を用いたイオンビームの相対強度分布測定法 von 石坂, 知久, 百合, 庸介, 上松, 敬, 湯山, 貴裕, 清藤, 一, 奥村, 進

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