Fast adaptive algorithms for micromagnetics von Yuan, S.W., Bertram, H.N.

Volltext

Advanced write heads for high density and high data rate recording von Yuan, S.W., Lee, E., Hsiao, W., Santini, H., Lam, H., Sui, G., Lam, T., Luo, Y., Madison, M., Nikitin, V., Webb, B., Shen, Y., Ramasubramanian, M., Jarratt, J., Hsiao, R., Harris, T., Sahami, S., Robertson, N., Freitas, D., Hsu, Y., Williams, M., Taratorin, A., Heidmann, J., Simmons, R., Smyth, J.

Volltext

Micromagnetics of GMR spin-valve heads von Yuan, Samuel W., Bertram, H. Neal

Volltext

Micromagnetics of small unshielded MR elements von YUAN, S. W, BERTRAM, H. N

Volltext

Track-edge read-write effect of inductive/MR dual element heads von Yuan, S.W., Thayamballi, P., Hua-Ching Tong

Volltext

Magnetic thin film domain wall motion under dynamic fields von YUAN, S. W, BERTRAM, H. N

Volltext

Correction to "Off-track Spacing Loss of Shielded MR Heads" von Yuan, S.W., Bertram, H.N.

Volltext

Off-track spacing loss of shielded MR heads von Yuan, S.W., Bertram, H.N.

Volltext

Exchange biasing schemes for MR disk heads von Yuan, S.W.

Volltext

Statistical data analysis of magnetic recording noise mechanisms von Yuan, S.W., Bertram, H.N.

Volltext

Size effects of switching fields of thin Permalloy particles von Yuan, S.W., Bertram, H.N., Smyth, J.F., Schultz, S.

Volltext

Correlation of MR head responses to uniform field and recording media excitations von Yuan, S.W., Kobayashi, T., Liao, S.H.

Volltext

Micromagnetic modeling of a narrow-track dual magnetoresistive head von Smith, N., Yuan, S.W.

Volltext

Magnetoresistive heads for ultra high density recording von Yuan, S.W., Bertram, H.N.

Volltext

Cross-track characteristics of shielded MR heads von Yuan, S.W., Bertram, H.N., Bhattacharyya, M.K.

Volltext

Domain-wall dynamics in thick permalloy films von YUAN, S. W, NEAL BERTRAM, H

Volltext

Domain-wall dynamic instability von YUAN, S. W, BERTRAM, H. N

Volltext

Micromagnetics of dual spin-valve GMR heads von Zhu, Jian-Gang, Ye, Xiao-Guang, Yuan, Samuel W., Tong, Hua-Ching, Rottmayer, Robert

Volltext

Modeling and measurement of hard-magnet biasing strengths on MR-SAL structures von Yuan, S.W., Liao, S.H., Kobayashi, T.

Volltext

Integrated touch-down pad and touch-down sensor von Chen, Yingjian, Seagle, David J, Yuan, Samuel W

Volltext bestellen